Quantitative Characterization of Nanostructured Materials with Fast TKD Measurement

Quantitative Characterization of Nanostructured Materials with Fast TKD Measurement

EDS, WDS, EBSD, Micro-XRF on SEM
This webinar took place on July 27th 2017

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Overview

This webinar will discuss the quantitative characterisation of nanostructured material using the e–FlashFS EBSD detector retrofitted with the OPTIMUS™ TKD head.

Significant improvements in light sensitivity and CCD dark current make the new Fast and Sensitive e–FlashFS detector the perfect solution for Transmission Kikuchi Diffraction (TKD) in SEM.

Using application examples, we will demonstrate how fast TKD measurements are achieved on different materials, without compromising the spatial resolution. When retrofitted with OPTIMUS™ TKD detector head, e–FlashFS detector enables orientation mapping at the nanoscale at speeds of up to 630 frames/sec.

The webinar will be round off by a 15-minute Q&A session where our experts will answer your questions.

Who should attend?

  • All-level users interested in characterization of nanostructured material
  • Researchers and specialists interested in Dark Field & Bright Field imaging as well as orientation mapping at the nanoscale
  • FIB/SEM microscopists interested in advanced analytical techniques

Speakers

Dr. Daniel Goran
Product Manager EBSD, Bruker Nano Analytics
Dr. Laurie Palasse
Senior Application Scientist EBSD, Bruker Nano Analytics