Screening of Restricted Elements including Sample Thickness Correction

Screening of Restricted Elements including Sample Thickness Correction with the M1 MISTRAL Micro-XRF Spectrometer

X-ray Fluorescence
This webinar took place on November 03rd 2016

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Overview

The M1 MISTRAL combines the powerful Micro-XRF technique with an ease of operation in industrial quality control, for example, to determine contaminations and trace elements. Designed for fast and cost-efficient operation, the M1 MISTRAL provides accurate information on the elemental composition of materials through contactless, non-destructive analysis. It allows screening of restricted elements (heavy elements), which can partly replace or limit the amount of more costly analysis methods such as ICP-MS.

Virtually all kind of samples can be analyzed in this way, no matter the density, although certain specialties have to be taken into account and will be explained on real measurements during this webinar. The M1 MISTRAL is designed to be used with minimum considerations in advance, such as the sample thickness in case of low density samples. In addition to the benefits of Micro-XRF for the screening of restricted elements, the M1 MISTRAL uses small spot sizes for separating the sample area of interest. In combination with a stage program, the quality control workflows can be partially automated, ensuring systematic screening of the complete sample surface or multiple samples at once.

There will be a 15 minute Q&A session where our experts will answer your questions.

Who should attend?

  • Quality control specialists checking incoming material and final products for restricted elements (consumer goods, health care, electronic waste)
  • Personnel of regulatory agencies updating their possibilities in the regulation process

Speaker

Falk Reinhardt
Application Scientist Micro-XRF, Bruker Nano Analytics
Robert Erler
Product Manager Micro-XRF, Bruker Nano Analytics