Using Modern X-ray Diffraction Methods to Characterize GaN Based Devices

Using Modern X-ray Diffraction Methods to Characterize GaN Based Devices

This webinar took place on November 12th 2014

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Overview

Join Dr. Madhana Sunder and Brian Jones for a complimentary 30-minute interactive webinar followed by a live audience Q&A session discussing data collection and interpretation using the following methods to analyze GaN devices: X-ray Reflectivity, Reciprocal Space Mapping, High Resolution Rocking Curves and Grazing Incidence Diffraction.