silicon wafer failure

silicon wafer failure

IPFA 2025

Penang, Malaysia
August 6-8, 2025

32nd IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

Held at the SPICE Convention Centre, Penang, we will be showcasing our analytical solutions in the manufacturing of semiconductor materials. See you at Booths 14-15! Learn more about IPFA 2025 here.

Learn about our analytical solutions for failure analysis

Failure Analysis

EDS, WDS, EBSD, SEM Micro-XRF

Electron Microscope Analyzers

To extend your SEM/TEM analytical power, Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials, including analytical software for advanced materials research, process development and failure analysis.

EDS, WDS, EBSD and Micro-XRF

AFM-Materials-BRUKER

AFMs for Materials

Bruker's materials research atomic force microscopes, powered exclusively by PeakForce Tapping® technology, are helping researchers advance new nanomechanical, nanoelectrical, and nanoelectrochemical research, on the order of three peer-reviewed published articles per day.

Nanomechanical Test Systems

Nanomechanical Test Systems

Stand-alone solutions for highly accurate and reliable quantitative mechanical and tribological characterization at the nano- and microscales

NanoIR Spectrometers

Diffractometers & X-ray Microscopes

Bruker develops and manufactures analytical solutions for X-ray diffraction, scattering and X-ray microscopes. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.