This webinar focuses on how advanced stylus profiler techniques provide effective thickness metrology for fragile thin film surfaces, allowing researchers to both quantify progress and optimize materials and products.
Viewers can expect to gain new insight into:
Find out more about the technology featured in this webinar or our other solutions for thin film thickness and depth measurement:
Driven by automation for production, inter-connectivity demands and energy harvesting, Internet of Things (IoT) and green energy solutions are booming. Researchers from both academia and industries actively seek new processes as well as novel materials to develop light and low-cost flexible electronics, or self-power driven and recyclable sensors. Recent innovative devices notably contain stacks of multi-layer thin films with new alloy organic and/or intermetallic materials that are extremely fragile.
By its principle, stylus profiling already ensures unbiased topography even with transparent layers or a different refractive index.
The presentation showcases how advanced stylus profiling further extends to fragile surfaces such as PEDOT:PSS photovoltaic materials, PDMS microfluidic channels or amorphous-indium-gallium-zinc-oxide (IGZO) transistors. A successful solution relies on precise and low controlled force keeping topography unchanged while retaining sub-nanometer repeatability. Through these attributes, the DektakXT stylus profiler opens a wider range of applications for thickness metrology, from nanometers to millimeters.
Samuel Lesko, Ph.D.
Dir. of Technology and Apps Development for Tribology, Stylus & Optical Profilers, Bruker