Stylus profilometry is capable of providing unbiased characterization of surface topography even for samples composed of or containing transparent layers or different refractive indexes. In this webinar, our speaker will demonstrate how advanced stylus profiler techniques can be further applied to fragile thin film surfaces for accurate and repeatable thin film thickness and depth measurement.
Webinar attendees can expect to gain new insight into:
Oct. 26, 2021 | 9AM PDT | 12PM EDT | 6PM GMT+1
Registration required to attend.
Driven by automation for production, inter-connectivity demands and energy harvesting, Internet of Things (IoT) and green energy solutions are booming. Researchers from both academia and industries actively seek new processes as well as novel materials to develop light and low-cost flexible electronics, or self-power driven and recyclable sensors. Recent innovative devices notably contain stacks of multi-layer thin films with new alloy organic and/or intermetallic materials that are extremely fragile.
In this webinar, we illustrate how Bruker's advanced stylus profiler technique provides effective thickness metrology for such thin films, allowing researchers to not only quantify progress but also to optimize materials and products. By its principle, stylus profiling already ensures unbiased topography even with transparent layers or a different refractive index. The presentation will present evidence on how advanced stylus profiling further extends to fragile surfaces such as PEDOT:PSS photovoltaic materials, PDMS microfluidic channels or amorphous-indium-gallium-zinc-oxide (IGZO) transistors. A successful solution relies on precise and low controlled force keeping topography unchanged while retaining sub-nanometer repeatability. Through these attributes, the DektakXT stylus profiler opens a wider range of applications for thickness metrology, from nanometers to millimeters.
Senior Application Development Manager