Tuesday, October 26 | 9AM PDT | 12PM EDT | 6PM GMT+1

Stylus Profiling Metrology for Soft Matter: Film Thickness and Depth for Flexible Electronic and Microfluidic Devices

presented by Samuel Lesko, Director of Technology and Application Development, Bruker

Explore the most innovative capabilities of advanced stylus profilers.

Stylus profilometry is capable of providing unbiased characterization of surface topography even for samples composed of or containing transparent layers or different refractive indexes. In this webinar, our speaker will demonstrate how advanced stylus profiler techniques can be further applied to fragile thin film surfaces for accurate and repeatable thin film thickness and depth measurement.

Webinar attendees can expect to gain new insight into:

  • How advanced stylus profiler techniques provide an optimal thickness metrology solution for these and other thin films.
  • The benefits and advantages of using advanced surface profilometry for thin film analysis.
  • The range of applications for nanometer- to millimeter-scale thickness metrology made possible by advanced surface profiler techniques and instrumentation.

 


Oct. 26, 2021 | 9AM PDT | 12PM EDT | 6PM GMT+1
Registration required to attend.


For more information about this event or the products and techniques featured in it, please contact us.

Controlling the Thickness Profile of Thin Films with Advanced Stylus Profilometry

Driven by automation for production, inter-connectivity demands and energy harvesting, Internet of Things (IoT) and green energy solutions are booming. Researchers from both academia and industries actively seek new processes as well as novel materials to develop light and low-cost flexible electronics, or self-power driven and recyclable sensors. Recent innovative devices notably contain stacks of multi-layer thin films with new alloy organic and/or intermetallic materials that are extremely fragile.

In this webinar, we illustrate how Bruker's advanced stylus profiler technique provides effective thickness metrology for such thin films, allowing researchers to not only quantify progress but also to optimize materials and products. By its principle, stylus profiling already ensures unbiased topography even with transparent layers or a different refractive index. The presentation will present evidence on how advanced stylus profiling further extends to fragile surfaces such as PEDOT:PSS photovoltaic materials, PDMS microfluidic channels or amorphous-indium-gallium-zinc-oxide (IGZO) transistors. A successful solution relies on precise and low controlled force keeping topography unchanged while retaining sub-nanometer repeatability. Through these attributes, the DektakXT stylus profiler opens a wider range of applications for thickness metrology, from nanometers to millimeters.

Speaker

Samuel Lesko

Bruker (USA)

Senior Application Development Manager

Samuel has Ph.D. and engineering degrees in material science from the University of Burgundy in France. Since 2000, he has built extensive experience in optical profiling technology, particularly in using white light interferometry applied to MEMS, semiconductor, automotive and aerospace applications. His vast experience and passion in correlating roughness parameters with the performance of devices or parts has aided countless researchers and engineers in both academic and industrial settings.

More Information

Surface Profilometry Application Notes