X-ray Diffraction

EIGER2 R detectors

Multi-Mode (0D/1D/2D) detector based on hybrid photon counting technology by DECTRIS
modi of operation
Seamless integration of multi-mode detection to measure diffraction data in the most efficient way for every sample
sample-to-detector distance
Continuously variable detector positioning to balance coverage and angular resolution for all applications
pixel size
Optimized for maximum angular resolution and minimum photon loss due to charge-sharing effects
The next generation HPC detector for the most powerful XRD Platform.
D8 Family with EIGER2 R detectors

The Next Generation HPC Detector for the Most Powerful XRD Platform

The EIGER2 R 250K and 500K are an easy-to-use, multi-mode (0D/ 1D/ 2D) detectors for the D8 ADVANCE and D8 DISCOVER diffractometer families.

These Hybrid Photon Counting (HPC) detector are based on the 2nd generation of Dectris’ revolutionary synchrotron-proven EIGER technology. The large 2D area with 75x75µm2 pixels allows for wide coverage with fine resolution. Dual energy thresholds and a high dynamic range enable accurate measurement of weak and strong signals alike. Bruker’s complete and seamless integration of the EIGER2 in the DIFFRAC.SUITE architecture, the ergonomic design of the detector mount and dedicated accessories result in a powerful and easy-to use solution.

Users can take full advantage of the impressive detector features for a wide range of measurement methods ranging from powder diffraction to materials research applications. Not a typical jack of all trades, the EIGER2 is a master of all applications:

The new EIGER2 R 250K detector with a square sensor and over 250,000 pixels is the perfect size for ultra-fast data collection for powder diffraction or reciprocal space maps, and its high dynamic range enables absorber free HRXRD and XRR measurements of thin films.

The EIGER2 R 500K with 500,000 pixels offers over 1000 channels for rapid non-ambient experiments and fast pair-distribution function analysis, and the highest angular coverage for 2D applications including SAXS, texture and microdiffraction experiments.  

Key Benefits

Multimode detector

The EIGER2 is seamlessly integrated into the DIFFRAC.SUITE architecture: 0D, 1D and 2D data acquisition modes are implemented consistently with step, continuous and advanced measurement types. Best data quality is ensured by our patented algorithms that deliver distortion free 2D scanning data without smearing.

The EIGER2 supports every data collection strategy efficiently and allows users to obtain best diffraction data for every sample type:

  • 0D mode for samples with rough surfaces, polycrystalline coatings and epitaxial thin films
  • 1D mode for ultra-fast scans on powders, measured either in reflection (Bragg-Brentano) or in transmission geometry, as well as for reciprocal space mapping of epitaxial thin films
  • 2D mode for small sample quantities, materials with preferred orientation or large crystallite sizes, for micro-mapping and for stress and texture analysis

Unrivaled ergonomic design

Whether you need large 2θ-coverage for fast powder diffraction snapshots or a wide γ-range for texture measurements, whether you want to capture a large part of the diffracted beam for SAXS/WAXS or need high angular resolution to separate closely spaced peaks - with the EIGER2 it takes only moments to optimize the instrument set-up.

The ingenious design of the Universal Detector Mount Plus enables tool-free changing of detector orientation and sample-to-detector distance for rapid switching between different applications, without having to compromise on data quality:

  • Compact and lightweight design with integrated real-time recognition of detector orientation and mounted accessories
  • Failsafe, alignment free rotation of the detector to optimize γ and 2θ angular coverage in seconds - the available scan types are automatically adapted to the detector orientation
  • Continuously variable detector position from 100 mm up to 500 mm, with automatic distance calibration on the D8 DISCOVER – balancing angular coverage and resolution has never been easier.

Dedicated optics

Panoramic, tool-free diffracted beam optics using the complete detector field of view were specifically designed for the EIGER2. The optics are magnetically mounted and equipped with real-time DAVINCI component recognition. These accessories complement the EIGER2 detection solution by minimizing parasitic scattering or other adverse effects such as smearing of the diffraction rings in 0D and 1D mode.

Available accessories include:

  • Panoramic filters, filtering K-beta radiation
  • Panoramic axial Sollers, reducing smearing and peak-asymmetry in Bragg-Brentano and Debye-Scherrer geometry
  • Panoramic evacuated flight tubes and beam-stops, minimizing the effects of air scattering for Small-Angle X-ray Scattering (SAXS) applications

EIGER2 R Detector Specifications




Active Area

250K: 38.4 x 38.4 = 1,475 mm²
500K: 77.1 x 38.4 = 2,961 mm²

Large field of view with tuneable γ- and 2θ-coverage


250K: 512 x 512 = 262,144
500K: 1,028 x 512 = 526,336

Excellent spatial resolution across the active area

Pixel size

75 x 75 μm²

Balance resolution and count rate

Minimize charge-sharing

Max. count rate

>3.6 x 10⁸ ph/s/mm²

Perfect for high dynamic range measurements, such as XRR and HRXRD, without the need for absorbers

Dynamic Range

> 10⁹ ph/s/mm²

Maximum sensitivity for best 2D data quality


2, lower and upper threshold

Improved signal-to-background through reduction of fluorescent and cosmic radiation


2nd generation EIGER technology, Hybrid Photon Counting

Fast conversion of photon for highest count rates and dynamic range


Cr, Co, Cu, Mo and Ag (5 keV – 23 keV)

Synchrotron proven radiation stability

One detector for all common wavelengths

No damage by direct beam

Sensor thickness

450 μm

> 99% Cr, Co, Cu; 50% Mo; 30% Ag sensor efficiencey

Scan modes

0D, 1D and 2D step and continuous scans

1D and 2D Snap-Shot and advanced scan modes

Comprehensive and unified 0D/1D/2D scan implementation

Flexible ROI selection along γ- and 2θ in all modes

Distortion-free 2D data algorithms (patent pending)

Operating Media


No maintenance and no additional cost for consumables

Media-free design ensures long detector life without routing maintenance


XRR, HRXRD; Phase Identification, quantification, Structure refinement, residual stress, texture, micro-mapping, 2D diffraction


Service & Support