EIGER2 R detectors
The Next Generation HPC Detector for the Most Powerful XRD Platform
The EIGER2 R family are an easy-to-use, multi-mode (0D/ 1D/ 2D) detectors for the D8 ADVANCE and D8 DISCOVER diffractometer platforms.
These Hybrid Photon Counting (HPC) detectors are based on the 2nd generation of Dectris’ revolutionary synchrotron-proven EIGER technology. The large 2D area with 75x75µm2 pixels combines wide coverage with fine resolution. Dual energy thresholds and a high dynamic range enable accurate measurement of weak and strong signals alike. Bruker’s complete and seamless integration of the EIGER2 in the DIFFRAC.SUITE architecture, the ergonomic design of the detector mount and dedicated accessories results in a powerful and easy-to use solution for any application.
The EIGER2 R 250K detector has over 250,000 pixels and is the perfect size for ultra-fast data collection for power diffraction or reciprocal space maps, and its high dynamic range enables absorber-free HXRD and XRR measurements of thin films.
The EIGER2 R 500K offers double the pixels and sensor area, resulting in the highest angular coverage for rapid non-ambiant experiments or 2D applications like SAXS/WAXS, texture, and microdiffraction experiments.
The EIGER2 R CdTe 500K features a high efficency cadmium telluride sensor, perfect for hard radiation applications like pair distribution function analysis.
NEW! EIGER2 R CdTe 500K
The cadmium telluride sensor version, the EIGER2 R CdTe 500K, offers the highest quantum efficiency for molybdenum (Mo) and silver (Ag) radiation. A CdTe sensor is the ideal choice for applications requiring high energy X-rays like pair distribution function (PDF) analysis.
And just like the other members of the EIGER2 family, the EIGER2 R CdTe 500K is fully integrated into DIFFRAC.SUITE, meaning all measurement modes, scan types, and applications are supported.
Key Features
Key Benefits
Multimode detector
The EIGER2 is seamlessly integrated into the DIFFRAC.SUITE architecture: 0D, 1D and 2D data acquisition modes are implemented consistently with step, continuous and advanced measurement types. Best data quality is ensured by our patented algorithms that deliver distortion free 2D scanning data without smearing.
The EIGER2 supports every data collection strategy efficiently and allows users to obtain best diffraction data for every sample type:
- 0D mode for samples with rough surfaces, polycrystalline coatings and epitaxial thin films
- 1D mode for ultra-fast scans on powders, measured either in reflection (Bragg-Brentano) or in transmission geometry, as well as for reciprocal space mapping of epitaxial thin films
- 2D mode for small sample quantities, materials with preferred orientation or large crystallite sizes, for micro-mapping and for stress and texture analysis
Unrivaled ergonomic design
Whether you need large 2θ-coverage for fast powder diffraction snapshots or a wide γ-range for texture measurements, whether you want to capture a large part of the diffracted beam for SAXS/WAXS or need high angular resolution to separate closely spaced peaks - with the EIGER2 it takes only moments to optimize the instrument set-up.
The ingenious design of the Universal Detector Mount Plus enables tool-free changing of detector orientation and sample-to-detector distance for rapid switching between different applications, without having to compromise on data quality:
- Compact and lightweight design with integrated real-time recognition of detector orientation and mounted accessories
- Failsafe, alignment free rotation of the detector to optimize γ and 2θ angular coverage in seconds - the available scan types are automatically adapted to the detector orientation
- Continuously variable detector position from 100 mm up to 500 mm, with automatic distance calibration on the D8 DISCOVER – balancing angular coverage and resolution has never been easier.
Dedicated optics
Panoramic, tool-free diffracted beam optics using the complete detector field of view were specifically designed for the EIGER2. The optics are magnetically mounted and equipped with real-time DAVINCI component recognition. These accessories complement the EIGER2 detection solution by minimizing parasitic scattering or other adverse effects such as smearing of the diffraction rings in 0D and 1D mode.
Available accessories include:
- Panoramic filters, filtering K-beta radiation
- Panoramic axial Sollers, reducing smearing and peak-asymmetry in Bragg-Brentano and Debye-Scherrer geometry
- Panoramic evacuated flight tubes and beam-stops, minimizing the effects of air scattering for Small-Angle X-ray Scattering (SAXS) applications
Applications Gallery
EIGER2 R Detector Specifications
Specification |
Benefit |
|
Active Area |
250K: 38.4 x 38.4 = 1,475 mm² |
Large field of view with tuneable γ- and 2θ-coverage |
Pixels |
250K: 512 x 512 = 262,144 |
Excellent spatial resolution across the active area |
Pixel size |
75 x 75 μm² |
Balance resolution and count rate Minimize charge-sharing |
Max. count rate |
>3.6 x 10⁸ ph/s/mm² |
Perfect for high dynamic range measurements, such as XRR and HRXRD, without the need for absorbers |
Dynamic Range |
> 10⁹ ph/s/mm² |
Maximum sensitivity for best 2D data quality |
Discriminators |
2, lower and upper threshold |
Improved signal-to-background through reduction of fluorescent and cosmic radiation |
Technology |
2nd generation EIGER technology, Hybrid Photon Counting |
Fast conversion of photon for highest count rates and dynamic range |
| Sensor type | 250K: Si 500K: Si or CdTe |
|
Wavelengths |
Si sensor: Cr, Co, Cu, Mo and Ag (5 keV – 23 keV) CdTe sensor: Cu, Mo, and Ag (8 keV – 25 keV) |
One detector for all common wavelengths CdTe sensor: Optimized for high energy applications |
Sensor thickness |
Si sensor: 450 µm Si CdTe sensor: 750 µm CdTe |
Si sensor: > 99% Cr, Co, Cu; 50% Mo; 30% Ag sensor efficiency CdTe sensor: > 95% efficiency for all supported wavelengths |
Scan modes |
0D, 1D and 2D step and continuous scans 1D and 2D Snap-Shot and advanced scan modes |
Comprehensive and unified 0D/1D/2D scan implementation Flexible ROI selection along γ- and 2θ in all modes Distortion-free 2D data algorithms (patent pending) |
Operating Media |
Si sensor: None CdTe sensor: water and dry air (included) |
No maintenance and no additional cost for consumables |
Applications |
XRR, HRXRD, phase identification and quantification, structure refinement, residual stress, texture, micro-mapping, 2D diffraction, pair distribution function |
One detector for all applications |
EIGER2 Detector Family Resources
Application Notes & Lab Reports
- X-Ray Reflectometry with the EIGER2: Investigation of a Ta coating on Si and a GaN/AlN superlattice
- Large-Area RSM with the EIGER2 R 500K: Analysis of InxGa1-xN LED, GaAs and Si1-xGex epitaxial films
- Texture Analysis with EIGER2 R 500K and DIFFRAC.TEXTURE: Investigation of Rolled and Drawn Aluminum Sheets
- Residual Stress with EIGER2 R 500K: 0D, 1D, and 2D investigation of a polycrystalline tungsten coating on silicon
- μXRD in Geology with EIGER2 R 500K: In-Situ Study of Lazulite from Graves Mountain, Georgia, USA
- Rapid XRD Analysis of Pharmaceuticals: Snapshot 1D and 2D Mode with the EIGER2 R 500K
Flyers & Product Sheets
Service & Support
- Helpdesk for technical issues with hardware, software, and applications support using web based and advanced remote service tools.
- LabScape Maintenance Service Agreements
- On-site, on-demand support
- Installation and operational qualification as well as performance verification
- Site planning, relocation, and consultation
- Replacement and spare parts, consumables, and in-person and online training
- Software updates, manuals, and LabScape MSA management (↗brukersupport.com)