VÅNTEC-500 detector

The VÅNTEC-500 detector is the core technology for the next generation of 2D XRD systems by combining the best features of classic X-ray film and electronic single X-ray photon detection. Its huge detector area of more than 15,000 mm² grabs as much 2-D information as classic film cameras in just a few seconds. Superb counting statistics is achieved by “seeing” and counting individual photons in real time. Thanks to the proprietary MIKROGAP™ technology the VÅNTEC-500 can be operated at high count rates while operating virtually noise free. The only source of background is cosmic rays and the material’s natural radioactivity, which accounts to less than 5 cps over the whole detector area. Hence, it is well-suited for the analysis of both weakly and strongly scattering samples.

The MIKROGAP design results in a very stable detector which is maintenance free, insensitive to mechanical shock or movement, and can withstand intensive and high energy radiation without damage. Thanks to extensive experience and in-house detector development, the VÅNTEC-500 is guaranteed to be exemplary and without any defective detector areas.

In a MIKROGAP detector, the grid, the anode, the delay lines and the Xe-CO 2 gas mixture are contained in a sealed vessel with a beryllium entrance window. In the conversion region, the incoming X-ray photons produce primary electrons by gas ionization. These electrons drift towards the anode under a high electric field. The number of electrons is multiplied in the amplification gap. This signal amplification is by far larger than any solid-state detector provides thus very weak signals can be detected. The location of each X-ray photon is determined by readout strips through the X and Y delay lines. The key feature of the MIKROGAP technology is the presence of a resistive anode to allow a very thin amplification gap, which greatly improves the local count rate.

The successful application of the 2D XRD method requires an intelligent and integrated approach, both on the hardware and software level.

The DIFFRAC.SUITE software provides the optimum measurement strategy. It proposes the best settings for optimized data collection in different geometries. The Debye view allows you to identify Debye rings with similar properties in terms of spottiness and texture, for example. Only the Debye rings with identical charac-teristics can belong to the same crystalline phase. Use our unique SEARCH/MATCH function to identify the crystalline phases. Other software capabilities include:

• 2D XRD measurement scheme and planning fully integrated into DIFFRAC.MEASUREMENT and DIFFRAC.WIZARD
• Native support of 2D frames in DIFFRAC.TEXTURE for generating pole figures and Orientation Distribution Functions (ODFs)
• Residual stress using 2D mode fully supported in DIFFRAC.LEPTOS

The hardware integration of the VANTEC-500 reflects the DAVINCI design principal completely.

DAVINCI.MODE

• Instant component registration with all specific properties
• Fail-safe positioning
•  Automatic detector distance recognition

DAVINCI.SNAP-LOCK – changing components without tools

• Fast and easy without tools
• Alignment-free
• Variable positioning on the track

DIFFRAC.DAVINCI

• Real-time component recognition and status display
• Detection of missing, misplaced or unsuitable components
• Parameterization of all fixed and motorized components