X-ray Diffraction

VÅNTEC-500 detector

Largest 2D detector based on proprietary MIKROGAP™ technology


>15,000 mm²
Huge 2Theta and Gamma coverage in a single snapshot
<0.0005 cps/mm²
Virtually noise-free, the detector is highly sensitive to very weak diffraction signals
0 per year
Robust design is radiation hard, insensitive to movement and vibration, stable and requires no maintenance

VÅNTEC-500 large field-of-view 2D detector

The VÅNTEC-500 detector is the core technology for the next generation of 2D XRD systems by combining the best features of classic X-ray film and electronic single X-ray photon detection. Its huge detector area of more than 15,000 mm² grabs as much 2-D information as classic film cameras in just a few seconds. Superb counting statistics is achieved by “seeing” and counting individual photons in real time. Thanks to the proprietary MIKROGAP™ technology the VÅNTEC-500 can be operated at high count rates while operating virtually noise free. The only source of background is cosmic rays and the material’s natural radioactivity, which accounts to less than 5 cps over the whole detector area. Hence, it is well-suited for the analysis of both weakly and strongly scattering samples.

The MIKROGAP design results in a very stable detector which is maintenance free, insensitive to mechanical shock or movement, and can withstand intensive and high energy radiation without damage. Thanks to extensive experience and in-house detector development, the VÅNTEC-500 is guaranteed to be exemplary and without any defective detector areas.

Key Benefits

MIKROGAP™ technology

In a MIKROGAP detector, the grid, the anode, the delay lines and the Xe-CO 2 gas mixture are contained in a sealed vessel with a beryllium entrance window. In the conversion region, the incoming X-ray photons produce primary electrons by gas ionization. These electrons drift towards the anode under a high electric field. The number of electrons is multiplied in the amplification gap. This signal amplification is by far larger than any solid-state detector provides thus very weak signals can be detected. The location of each X-ray photon is determined by readout strips through the X and Y delay lines. The key feature of the MIKROGAP technology is the presence of a resistive anode to allow a very thin amplification gap, which greatly improves the local count rate.

Large active area

For a 2D detector, size is the most important feature. A large detector window not only enables increased data collection speed, it also provides information that is simply not accessible with 0-D, 1-D or smaller 2-D detectors. The VÅNTEC-500 detector features a huge 140mm diameter window, covering up to about 80° (2θ) and a large γ-range. The flexible positioning of the detector along the track allows for a wide range of sample-to-detector distances to optimize angular coverage and resolution for various applications. This allows you to:

  • Collect several Bragg reflections over a large γ range in one frame
  • Measure several pole figures with background correction simultaneously
  • Cover broad diffraction peaks of a stressed sample in a single shot
  • Enhance the statistics on a spotty diffraction pattern of a micro sample

Full Hardware and Software Integration

The successful application of the 2D XRD method requires an intelligent and integrated approach, both on the hardware and software level.

The DIFFRAC.SUITE software provides the optimum measurement strategy. It proposes the best settings for optimized data collection in different geometries. The Debye view allows you to identify Debye rings with similar properties in terms of spottiness and texture, for example. Only the Debye rings with identical charac-teristics can belong to the same crystalline phase. Use our unique SEARCH/MATCH function to identify the crystalline phases. Other software capabilities include:

  • 2D XRD measurement scheme and planning fully integrated into DIFFRAC.MEASUREMENT and DIFFRAC.WIZARD
  • Native support of 2D frames in DIFFRAC.TEXTURE for generating pole figures and Orientation Distribution Functions (ODFs)
  • Residual stress using 2D mode fully supported in DIFFRAC.LEPTOS


The hardware integration of the VANTEC-500 reflects the DAVINCI design principal completely.


  • Instant component registration with all specific properties
  • Fail-safe positioning
  •  Automatic detector distance recognition

DAVINCI.SNAP-LOCK – changing components without tools

  • Fast and easy without tools
  • Alignment-free
  • Variable positioning on the track


  • Real-time component recognition and status display
  • Detection of missing, misplaced or unsuitable components
  • Parameterization of all fixed and motorized components

Detector Specifications


Specification Benefit

Sensor Type
Photon-counting, Xe-based MIKROGAP™ detector (US Patent 6,340,819 )
Highest overall performance of any gas-filled XRD detector
Window Size
 140 mm diameter
Shows scattering not visible on smaller detectors

Very fast detection time

Number of pixels

2048 x 2048 (68 µm),

1024 x 1024 (136 µm),

512 x 512 (272 µm)
Higher resolution to clearly show closely spaced scattering or diffraction features
2Ɵ coverage and difference sample distances 10 cm - 56°,

15 cm - 42°,

20 cm - 33°,

25 cm - 27°,

30 cm - 23°
Optimize sample to detector distance for coverage and angular resolution
Energy Range
3-15 KeV (Cr, Fe, Co and Cu radiation)
Compatible with most XRD wavelengths for experimental flexibility
Background < 5 cps per whole area (< 0.0005 cps/mm²) Sensitive to weakly scattering samples
Radiation Hardness 10₁₂ X-ray photons/mm² (10₁₆ photons in total) Ease of use
Maintenance  not required Ease of use and low cost of ownership

Service & Support