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Lunch & Learn with Bruker at M&M

We’re hosting Lunch & Learns right in our Booth 614, where Bruker scientists will present on key applications and technologies. Space is limited, so register early to guarantee your lunch.

Monday, August 3 | Maximizing XRM (Micro-CT) Detail with Variable Geometry on the Bruker X4 POSEIDON

The Bruker X4POSEIDON advances benchtop 3D X-ray microscopy (XRM) by delivering high-performance imaging within a compact, modular platform. A key innovation is its variable scanner geometry enabled through Geometric Magnification + Multi-Vision (GEM+), integrating dual detectors to extend the achievable range of spatial resolution and field of view.

This presentation demonstrates how adjustment of source–sample–detector geometry, combined with Multi-Vision, enables optimization of imaging conditions across feature sizes and materials. Practical workflows highlight how scan speed, resolution, and field of view can be balanced to maximize structural detail and contrast.

A representative sample demonstrates how variable geometry in XRM enables multi-scale visualization of internal structures, improving data quality and feature resolution compared to traditional fixed-geometry approaches.

Tuesday, August 4 | eWARP - Best Spatial Resolution, Maximum Throughput, Zero Compromise

eWARP is the pioneering EBSD detector that works via electrons only. Powered by a revolutionary Bruker-designed camera that combines direct electron detection and CMOS technologies, eWARP delivers unmatched performance and elevates the technique of EBSD to a new level.

eWARP is by far the fastest and most signal efficient EBSD detector in the market. The detector can acquire EBSD maps at a speed of up to 14,400 patterns/second requiring only low-to-medium electron beam conditions, e.g., an accelerating voltage of 10 kV and a probe current of 12 nA.

Wednesday, August 5 | Speed Meets Cold: Pushing Nanoindentation Mapping to Cryogenic Temperatures

The Hysitron PI 89 SEM PicoIndenter provides advanced capabilities for in-situ nanomechanical testing at cryogenic temperatures. Understanding material behavior under these conditions is critical for applications in nuclear materials, aerospace systems, quantum technologies, and superconducting devices, where extreme environments can significantly influence deformation mechanisms. This demonstration will showcase high-speed mechanical property mapping (XPM) of a sample at cryogenic temperature inside a scanning electron microscope.
 

Thursday, August 6 | Introduction to STEM

Scanning Transmission Electron Microscopy (STEM) is a versatile technique for atomic scale imaging, diffraction, and spectroscopy. In this tutorial, we will briefly cover the basic principles of STEM, basic imaging (ADF, BF) and spectroscopy (EELS, EDS, EEGS, CL) methods and highlight features of the Nion STEM that make it a cutting-edge platform for atomic scale imaging and spectroscopy.

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