November 28, 2018

Bruker Launches New Dimension XR Family of Scanning Probe Microscopes

Featuring Major Advances in AFM Technology for Nanoscale Quantification

SANTA BARBARA, California – November 28, 2018 – Bruker today announced the release of the Dimension XR™ family of scanning probe microscopes (SPMs). These new systems incorporate major AFM innovations, including Bruker’s proprietary and exclusive DataCube nanoelectrical modes, AFM-SECM for energy research, and the new AFM-nDMA mode, which for the first time correlates polymer nanomechanics to bulk dynamic mechanical analysis (DMA). Building on two of the world’s most utilized AFM platforms in scientific publications, the Icon® and FastScan®, Dimension XR SPMs are available in three configurations optimized for nanomechanics, nanoelectrical, and nanoelectrochemical applications. These systems significantly expand researchers’ ability to quantify material properties at the nanoscale in air, fluids, electrical, and chemically reactive environments.

“The new Dimension XR systems are the culmination of years of innovations to provide quantitative and easy-to-use nanomechanical, nanoelectrical, and nanoelectrochemical characterization,” explained David V. Rossi, Executive Vice President and General Manager of Bruker’s AFM business. “Our goal is to make these first and only capabilities widely available to the research community, enabling their breakthrough AFM discoveries with new nanoscale information.”

About Dimension XR SPMs

Bruker’s Dimension XR systems are available on either the Icon or FastScan AFM platforms, and feature three configurations that provide out-of-the-box characterization for breakthrough nanomechanics, nanoelectrical, and nanochemical research. The Dimension XR Nanomechanics configuration combines AFM-nDMA, PeakForce QNM, FASTForce Volume, and FASTForce Volume CR modes to rapidly and quantitatively characterize materials for their nanomechanical characteristics. The Dimension XR Nanoelectrical configuration includes PeakForce TUNA™, PeakForce KPFM™ and DataCube modes for the most complete array of electrical AFM techniques on a single system. The Dimension XR NanoEC configuration utilizes Bruker-unique nanoelectrode probes with EC-AFM and PeakForce SECM™ modes to perform in-situ topography scans in the electrochemical environment, providing a turnkey solution for real-time quantitative analysis of nanoscale local reactivity.

Media Contact:
Stephen Hopkins
Content Marketing Manager
Bruker Nano Surfaces Division
T: +1 (520) 741-1044 x1022
E: steve.hopkins@bruker.com