The Most Complete TERS Solution

Enabling highest performance AFM-Raman research

  • Delivering high-performance TERS with complete SPM capabilities
  • Offering performance exclusively enabled by Bruker's commercially available TERS probes
  • Providing productive measurement with guaranteed TERS performance

Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly blending atomic force microscopy and Raman spectroscopy.

This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.

Request More Information about the Innova-IRIS

Download the AFM-Raman brochure and Innova-IRIS datasheet