software, X-ray diffraction, DIFFRAC.SUITE

LEPTOS H

LEPTOS H stands for High-Resolution X-ray Diffraction and Grazing-Incidence X-ray Diffraction data analysis.

 

The module is fully integrated in the LEPTOS suite, which incorporates the simultaneous analysis of HRXRD, GISAXS and XRR data. As a part of the LEPTOS suite, the H module inherits all the functionality common for the whole package.

LEPTOS H Software, XRD
LEPTOS H contains an Area Mapping module that makes it possible to treat HR-XRD data taken point-by-point over a large sample area and to display mappings of sample parameters.

 

 

Theory

  • Fast 2x2 and precise 4x4 Recursive Matrix Formalism to overcome the limitations of the Takagi-Taupin approach
  • Operator Method for the universal calculation of X-ray scattering parameters from crystalline materials, such as: atomic scattering factors, X-ray polarizabilities, etc.
  • Patented Method of EigenWaves (MEW) for the essential acceleration of the fits for the superlattices and repeating multilayers

Sample editor

  • Powerful and flexible sample model editor including tools for superlattices, linking of layer physical parameters, user-defined layer profiles
  • Extensive, user extendable materials database
  • Cell Builder engine for automatic adjustment of the sample crystallographic properties: lattice strain and mismatches, relaxation degree, elemental concentrations and mass density
  • Virtual Diffractometer tool to account for the instrumental resolution function and footprint effects

Data evaluation

  • Simulation, estimation and fitting of data in direct and reciprocal spaces
  • Simultaneous evaluation of several Bragg reflections measured from one sample
  • Fast Fourier Transform for a quick estimation of the layer thickness and the Estimate tool for the fast evaluation of sample parameters from peak postions, directly from measured data
  • Precise fitting of numerous sample parameters using the advanced dynamical theory. Available fitting routines: Genetic Algorithm, Simulated Annealing, Simplex or Levenberg-Marquardt
  • Consideration of the nonpolar orientations of the crystallographic unit cell and various {hkl} reflections in a single sample
  • Area mapping; automated data evaluation via script interface

Output

  • Saving of results in XML-based project files
  • Several reporting options and customizable export