Atomic force microscopy (AFM) is best known for acquiring high-resolution images of surface topography. For materials research, even more valuable is the unique ability of AFM to provide quantitative, nanoscale maps of advanced material properties that directly correlate to structural data.
In this two-day meeting for AFM Users, we will be joined by leading experts who will share their latest work in studying the nanomechanical and nanoelectrical properties of materials. From polymer mechanics and compositional mapping, electrochemical analysis, and piezoelectric materials, to the potential role of machine learning in AFM studies – a full-range of exciting and cutting-edge topics will be discussed.
We will also have live demonstrations of the latest advances in Bruker’s AFM technology. As well as the opportunity to meet and talk to some of your local Bruker AFM Team.