QUANTAX 75 is a new EDS system specially designed for the Hitachi TM4000 Tabletop Microscope. QUANTAX 75 consists of a XFlash® silicon drift detector (SDD) with the best energy resolution in its field, a small electronics unit and an easy-to-use ESPRIT Compact software.
The system performs qualitative and quantitative analyses of all materials with an element range from boron (5) to californium (98). Besides composition analysis at individual spots on the sample surface, QUANTAX 75 provides powerful line scan and spectral element mapping functions. With the customized detector, the analysis and reporting is completed within seconds.