Bruker Nano Analytics presents:

Applied Comparison In Coating Analysis: micro-XRF and Handheld XRF

On-Demand Session - 63 Minutes

Applied Comparison in Coating Analysis

The range of application in coating analysis covers Automotive, Electronics, Jewelry and General Metal Finishing. Within these industries the analytical challenges partially differs a lot and must be considered for selecting the right solution. A thorough understanding of thickness and composition of coatings is critical to optimize the coating process and ensure that coating has intended functionality.

X-ray fluorescence (XRF) is a versatile tool for coatings quality control as it can be used to analyze both coating thickness and the composition of coatings and bulk materials. Bruker offers a variety of different XRF instruments to meet different coatings analysis requirements.

This webinar will discuss the measurements of coatings using the Bruker M1 MISTRAL Micro-XRF spectrometer and Bruker S1 TITAN handheld XRF analyzer. Micro-XRF and handheld XRF are complementary coating analysis techniques which both provide some unique benefits. You will learn how to perform a straightforward, automated analysis using the programmable sample stage with Micro-XRF and how the handheld XRF can help to perform quick and non-destructive on-site measurements of large specimens or at difficult-to-reach locations.

There will be a 15 minute Q&A session where our experts will answer your questions.

Coatings are present in many different combinations on a huge variety of surfaces.
The M1 MISTRAL is a compact tabletop Micro-XRF spectrometer for the analysis of bulk materials and coatings.

Who Should Attend?

  • Quality control departments for production processes in Automotive, Electronics, Jewelry and General Metal Finishing
  • Testing Labs for on-demand analytics in the industries above
  • Decision makers for XRF Equipment purchase
Portable XRF spectrometers like the S1 TITAN allow you to take the battery operated analyzer to the sample rather than bringing the sample into the lab.


Falk Reinhardt

Senior Application Scientist micro-XRF, Bruker Nano Analytics

Robert Erler

Product Manager Micro-XRF, Bruker Nano Analytics

Tim Heek

Service and Application Engineer, Bruker Nano Analytics

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