In this webinar, two experts in the field of in situ nanomechanics present their latest research. Dr. Kris Vanstreels’s talk will be focused on understanding the strength and reliability of back-end-of-the-line (BEOL) layer stacks, which are utilized in the microelectronics industry. Dr. Peter Hosemann will discuss deformation mechanisms of materials at cryogenic temperatures. After the guest speakers conclude their presentations, the Bruker team will introduce and demonstrate the next generation Hysitron SEM PicoIndenter.
Dr. Kris Vanstreels
Researcher, IMEC
Dr. Peter Hosemann
Professor, University of California, Berkeley
Dr. Eric Hintsala
Applications Scientist
Sanjit Bhowmick, Ph.D.
Senior Staff Scientist, Bruker