Nanomechanical Testing

In Situ SEM Nanomechanics with Bruker’s PicoIndenter

Experts in the field discuss in situ nanomechanics with challenging samples and under extreme conditions in the scanning electron microscope.

Media

Overview

In this webinar, two experts in the field of in situ nanomechanics present their latest research. Dr. Kris Vanstreels’s talk will be focused on understanding the strength and reliability of back-end-of-the-line (BEOL) layer stacks, which are utilized in the microelectronics industry. Dr. Peter Hosemann will discuss deformation mechanisms of materials at cryogenic temperatures. After the guest speakers conclude their presentations, the Bruker team will introduce and demonstrate the next generation Hysitron SEM PicoIndenter.

Agenda:

Mechanical stability of advanced nano-interconnects -- Dr. Kris Vanstreels, IMEC
Micromechanical testing at cryostatic temperatures fracture and microstructural changes evaluated -- Dr. Peter Hosemann, UC Berkeley
Demonstration -- Eric Hintsala and Sanjit Bhowmick, Bruker

Speakers

Dr. Kris Vanstreels
Researcher, IMEC

Mechanical and thermal modeling and characterization, Interuniversity Microelectronics Centre (IMEC), Belgium

Dr. Peter Hosemann
Professor, University of California, Berkeley

Department of Nuclear Engineering at the University of California, Berkeley, USA

Dr. Eric Hintsala

Applications Scientist

Dr. Eric Hintsala is a Materials Scientist, with a B.S. from Michigan Technological University and Ph.D. from the University of Minnesota. Dr. Hintsala's background is in mechanical properties of materials, nanomechanical testing techniques, and electron microscopy. Dr. Hintsala is part of R&D at Bruker NI, where he develops advanced instrumentation and testing techniques. Topics of particular interest include in situ testing, elevated temperature “in operando” testing and high speed nanoindentation mapping.

Sanjit Bhowmick, Ph.D.

Senior Staff Scientist, Bruker

Dr. Sanjit Bhowmick is a Senior Staff Scientist at Bruker. His research interest includes understanding microstructure and mechanical property correlation of advance nanostructured materials using in-situ SEM and TEM nanomechanical techniques. He has published more than 80 papers in peer-reviewed journals.

More Information

Hysitron PI 89 SEM PicoIndenter

Robust, precise and modular in-situ SEM nanomechanical instrument

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Extended range in-situ nanomechanical testing instrument for scanning electron microscopes

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