Analysis of Surface Chemistry by FT-IR Spectroscopy
FT-IR techniquhref=%22#ueberschrift2%22%3Ee is an indispensable analytical tool in most chemical labs, analytical centers and quality control departments. FT-IR spectroscopy is an ease to use and non-destructive analytical method for verification, identification or quantification. To face the daily challenges arising from high sample amount, unknown materials and multiple (maybe unexperienced) users, you need a highly flexible FT-IR spectrometer with user-friendly automation and outstanding performance.
Bruker cares about your need and presents you the INVENIO spectrometer platform to make your daily work easy and convenient. In the upcoming free-of-charge webinar on the 18th of March we will focus on the difficulties in analytical labs and explain which features of INVENIO can help in such situations. This Webinar will be repeated on the 19th of March.
Please click here for registration and feel free to choose the more convenient date for you.
Key Learning Objectives
The latest advances in the instrumentation and applications of vibrational spectroscopy for the chemical analysis of surfaces will be reviewed in this presentation with a thorough discussion of the following topics:
- Surface characterization techniques: ATR (attenuated total reflection), including GATR (grazing angle germanium ATR): External (specular) reflection, including IRRAS (infrared reflection and absorption spectroscopy); and DRIFTS (Diffuse Reflection Infrared Fourier Transform Spectroscopy)
- Characterization of thin films and molecular monolayers deposited onto metallic, semiconductor, and dielectric substrates
- Heterogeneous gas-solid catalysis studies of gases interacting with catalytic surfaces
- Optimization of FT-IR instrument parameters for surface analysis
- Techniques to reduce the spectral contribution of atmospheric water and CO2
About the Speaker
Dr. Sergey Shilov
Product Manager, Bruker OpticsDr. Sergey V. Shilov is the Product Manager for North America at Bruker Optics. He earned his Ph.D. in physics from the Russian Academy of Sciences. Before joining Bruker in 2000, Dr. Shilov conducted research in Leipzig, Germany, and at Syracuse University in the United States. At Bruker, he leads initiatives to develop and support advanced applications for FTIR and Raman spectroscopy. He has authored over 40 peer-reviewed publications and has been an invited speaker at numerous international conferences. His scientific interests include time-resolved FTIR spectroscopy, surface science, polymer analysis, and applications in life sciences.
