Diffraction in micro-XRF – A tool, rather than a complication?
What to expect?
Micro-XRF is often understood as a tool for spatially resolved chemical analysis, both qualitative and quantitative. When X-rays are directed at a sample, they induce inner electron shell transitions, and the subsequently emitted radiation is analyzed in terms of intensity and energy to determine the sample's atomic composition.
However, for most metals, ceramics, minerals and other samples with crystalline structure, the X-rays are also diffracted by the samples, resulting in new peaks in the intensity spectrum with only distant relations to fluorescence. These diffraction peaks are often regarded as a nuisance – an undesirable effect that complicates the analysis of fluorescence, experimental setup, or both.
In this webinar, we will explore how diffraction signals in micro-XRF can be leveraged to gain additional insights beyond chemical composition. We will showcase applications in metallurgy, crystal growth, earth sciences, and more, discussing the impact of factors such as structural quality and crystal orientation.
Who should attend?
- Micro-XRF users in industry, science and R&D.
- Specific subfields: metallurgy, earth sciences, physics and crystallography
Our Speakers
Dr. Christian Hirschle
Application Scientist XMA, Bruker Nano Analytics
Falk Reinhardt
Senior Application Scientist micro-XRF, Bruker Nano Analytics
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