Chemical and Mechanical Analysis Across Multiple Length Scales

Bruker co-hosted a workshop with Gonzaga University and the Ferro Center for Materials Research. This event introduced participants to the broad capabilities and applications of FTIR microscopy, Raman spectroscopy, photothermal AFM-IR, and nanomechanical characterization.

The seminar featured introductory technical presentations for researchers and local industry professionals. Topics ranged from the nanomechanical characterization of materials and advanced chemical identification to nanoscale chemical analysis beyond the diffraction limit.

Following the seminar, participants had the opportunity to tour the Ferro Center for Materials Research, including a visit to the Bruker TS 77 Select nanoindenter, and attend practical FTIR microscopy demonstration sessions using the Bruker LUMOS II FTIR microscope.

We hope you enjoyed the workshop and gained valuable knowledge and practical insights to support your research.

If you have any questions about the workshop, please contact Dr. Ngan Pham at thi_kieu_ngan.pham@bruker.com.

Date: Sept 29-30, 2026, 10:00AM - 6:00PM PDT
Location: Bollier Center, Room 204 
Gonzaga University, 502 East Boone Avenue
Spokane, WA 99258-0102

_{Virtual Presentation}
Nanomechanical Characterization Using the TS 77 Select: From Soft Materials to Ceramics
Radhika Laxminarayana, NRL Development Engineer, Bruker Nano Surfaces and Metrology

This talk introduces the Bruker Hysitron TS77 Select and its capabilities for nanomechanical characterization across a wide range of materials, from soft polymers and biomaterials to hard metals and ceramics. Through application examples, attendees will learn how techniques such as nanoindentation and mechanical property mapping can be used to measure hardness, elastic modulus, and time-dependent behavior with high spatial resolution. The presentation will highlight best practices and demonstrate how the TS77 Select enables quantitative insights into local material performance and structure-property relationships.

From Contaminants to Microplastics: Advanced FTIR & Raman for Chemical Identification and Imaging
Dr. Sergey Shilov, Bruker Optics

Vibrational spectroscopy, including infrared (IR) and Raman spectroscopy, is highly effective for identifying chemical composition. Each compound produces a characteristic spectrum that serves as a unique "fingerprint" for identification. IR and Raman microscopes enable rapid chemical imaging of large samples with micron-level resolution. The resulting spectral images show how chemicals are distributed within a sample and can reveal contaminants.

This presentation will review recent advancements in vibrational spectroscopy instrumentation and its applications for chemical analysis, focusing on the following topics:

• Fast chemical analysis of contaminants
• Microplastics identification
• Failure analysis
• Biological tissue imaging

Application examples to be discussed include the analysis of surface and solution contaminants, multilayer films, batteries electrodes, electrical circuit failures, and the differentiation of cancerous and benign tissues.

IR Beyond the Diffraction Limit: Introduction and Applications of Photothermal AFM-IR for Nanoscale Chemical Analysis
Dr. Jin Hee Kim, Applications Scientist, Bruker Nano

Photothermal AFM-IR (atomic force microscopy infrared spectroscopy) is a nanoscale chemical characterization technique that bridges the gap between nanoscale structure and property mapping by an AFM and chemical identification with FTIR. By leveraging the nanometer scale AFM probe and the chemical specificity of FTIR, AFM-IR provides lateral resolution down to <10 nm with monolayer sensitivity. Because AFM-IR is built on the foundations of an AFM, chemical information can be acquired simultaneously with topographical and mechanical measurements enabling for multi-modal measurements. AFM-IR has been widely adopted to elucidate nanochemical heterogeneity present in a wide array of materials such as composites, films, 2D materials, biologics as well as supporting failure analysis and contaminations in industries. This presentation will introduce operating principles of AFM-IR, highlight its application across diverse research fields and key developments.

Prof. Harman Khare
Faculty Director, Ferro Center for Materials Research
Associate Professor of Mechanical Engineering
Gonzaga University

Dr. Ngan Pham
US West Coast Sales Manager
Bruker Nano Surfaces & Metrology
thi_kieu_ngan.pham@bruker.com