Application Training

Texture and Residual Stress Analysis

This training course will show the different methods used for orientation and residual stress measurement and analysis, including the DIFFRAC.TEXTURE and DIFFRAC.LEPTOS S software packages. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the X-ray Powder Diffraction or 2-Dimensional Diffraction course.

This class will be scheduled on request.

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Further Information




Class size

Because our trainings are interactive and learner-oriented, we limit class size to a maximum of six participants. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis. We reserve the right to cancel a course and will notify participants four weeks prior to the start date if the course is cancelled.


Attendance fee

The course fee is $1,870 USD per attendee per two-day session.


For further information about the course content, please contact:

Ben Krueger
Applications Scientist, XRD

For information about price, registration, or other questions:

Melanie Swanson
Marketing Specialist

For a quotation, please contact: