XRD Residual Stress
XRD Residual Stress
Application Training

Texture and Residual Stress Analysis

This training course will show the different methods used for orientation and residual stress measurement and analysis, including the DIFFRAC.TEXTURE and DIFFRAC.LEPTOS S software packages. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the X-ray Powder Diffraction or 2-Dimensional Diffraction course.

This class will be scheduled on request.

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Further Information




Class size

Because our trainings are interactive and learner-oriented, we limit class size to a maximum of six participants. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis. We reserve the right to cancel a course and will notify participants four weeks prior to the start date if the course is cancelled.


Attendance fee

The course fee is $1,870 USD per attendee per two-day session.


For further information about the course content, please contact:

Ben Krueger
Applications Scientist, XRD

For information about price, registration, or other questions:

Melanie Swanson
Marketing Specialist

For a quotation, please contact: