The Most Complete TERS Solution

Enabling highest performance AFM-Raman research

Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly blending atomic force microscopy and Raman spectroscopy.

  • Delivering high-performance TERS with complete SPM capabilities
  • Offering performance exclusively enabled by Bruker's commercially available TERS probes
  • Providing productive measurement with guaranteed TERS performance

Download Datasheet  Download Raman Solutions Brochure


Innova - The Best Place to Start Your AFM Research

This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.

Enabling highest performance AFM-Raman research

Download the AFM-Raman brochure and Innova-IRIS datasheet

Innova iris STM

Atomic-resolution STM image of highly oriented pyrolytic graphite (HOPG). Image size 1.3 nm.

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High-resolution topography (orange) and phase image (green) reveal the microphase separation in a poly(styrene-b-butadiene-b-styrene) (SBS) triblock copolymer. 1k x 1k unfiltered raw data.Image size: 2 μm. Closed-loop scan linearization active.

Providing Complete AFM Capabilities

All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultralow-noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultralow-noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid. With closed-loop noise levels approaching those of open-loop operation, superior image quality is achieved from the full 90-micron scan range down to submicron images on any sample, whether it is a semiconductor, a soft and nanostructured material, or DNA.

In addition, closed-loop scan linearization can be activated and deactivated on the fly.This incredible flexibility allows zooming down to atomic resolution on any selected portion of a full size scan, without changing scanner hardware and without withdrawing the probe from the surface.

Fast Setup for Every Experiment

The patented top-down optics of the Innova integrate seamlessly with all imaging modes. With softwarecontrolled optical zoom, they provide a broad range of magnification, allowing for a direct view of the cantilever and sample with better than 1-micron resolution to identify the smallest sample features and ensure precise probe positioning. With the optics positioned entirely inside the protective instrument cover, probe and sample can be viewed at any time while insolating the instrument from the environment. The ergonomic integration of the optics with the microscope also contributes to the ease and accuracy of tip exchange and laser alignment. The user can simply drop in a new tip and swing the optics back into place. The pre-aligned cantilever will always remain in focus.

Innova has also been specifically designed to provide quick and easy tip exchange and alignment. The Innova head rests kinematically on three independently controlled motors that allow height, pitch, and tilt adjustments relative to the sample, and user-defined positions can move the head in sub-micron increments. In addition, the system comes complete with a universal chip carrier that accepts almost any unmounted cantilever.

Innova iris fast setup

High-resolution phase image reveals the microphase separation in a poly(styrene-b-butadiene-b-styrene) (SBS) triblock copolymer. Image size: 750 nm. Closed-loop linearization active.

针对非透明样品,可以实现针尖增强拉曼(TERS)的AFM-Raman联用成像体系。Innova-IRIS 体系是AFM-Raman联用,实现针尖增强拉曼的最佳选择。

  • 结合原子力显微镜技术,呈现最高性能的针尖增强拉曼光谱
  • 使用布鲁克公司专有的针尖增强拉曼探针实现高性能测量
  • 确保TERS性能同时实现高效率测量

Innova-IRIS 体系利用拉曼成像技术获得样品的化学或者晶体学构象和光谱信息;同时可与AFM技术完美结合,获得其纳米尺度上的机械性质,电学性质和热力学性质等测量结果。

最完善的针尖增强拉曼光谱

为原子力显微镜-拉曼光谱研究提供最高分辨率

下载 AFM-Raman样本Innova-IRIS 数据手册