In December 2009, a new mode for atomic force microscopy was introduced – PeakForce Tapping. Since then it has been widely adopted in a broad range of research fields, outpacing all other recently developed AFM modes in research impact and productivity. PeakForce Tapping and its associated modes ScanAsyst, PeakForce QNM, PeakForce TUNA, PeakForce KPFM, and PeakForce SECM, have been cited in more than 4,000 peer-reviewed publications over the last ten years, with over 30% of these publications in the top 10% of journals. In this webinar we will select from this vast repository of publications to review the impact of PeakForce Tapping on today's science. In particular, we will examine how the measurement of mechanical and electrical properties at the nanoscale have led to new discoveries and insights into material behavior.
Bede Pittenger, Ph.D.
Bruker Nano Surfaces Sr. Staff Scientist, AFM Applications