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Quickly Analyze Nutrients, Additives, and Contaminants in Food, Feed, Supplements, and Beverages with pXRF and TXRF

This webinar will demonstrate the powerful combination of portable and benchtop X-ray fluorescence (XRF) spectrometers and its application to food samples and beverages. It will highlight the ease of sample preparation of liquid and solid samples avoiding laborious digestion procedures with hazardous chemicals.

This webinar will focus on the improved detection limits of a most modern Total Reflection X-Ray Fluorescence (TXRF) spectrometer. Several application examples of a variety of samples will be shown, e.g. the detection of the toxic elements in human food, dietary supplements, beverages and animal feed. In addition, the webinar will provide insights into the operational convenience of Portable X-ray Fluorescence (pXRF) spectrometers. Several application examples will be shown including the analysis of elemental nutrients and contaminants of concern in the manufacture and processing of food products.

Whether you are interested in quality control, research and development or cost-reduction of analytical services, this webinar will give you the information you need on the capabilities of the most modern pXRF and TXRF techniques.

There will be a 15 minutes Q&A session where our experts will answer your questions.

Who Should Attend

  • Quality control and safety assurance managers and technical assistants from the nutrition/food industry
  • Researchers at institutions for nutritional, veterinary, agrochemical and environmental sciences
  • Scientists at institutes for food engineering / food and biotechnology
  • Employees at institutions for public health, occupational safety and environmental protection

Speakers

Dr. Hagen Stosnach

Application Scientist TXRF, Bruker Nano Analytics

Dr. Armin Gross

Global Product Manager TXRF, Bruker Nano Analytics

Esa Nummi

Director Product Management, Bruker Nano Analytics

Kimberley Russell

Food Safety, Agriculture & Environmental Market Segment Manager, Bruker Nano Analytics