AFM Modes

Torsional Resonance MFM (TR-MFM)

Map magnetic field distribution with a sensitivity to lateral fields

TR‑MFM maps magnetic field distribution with a sensitivity to the lateral fields (in contrast to the vertical fields in conventional MFM). Magnetic domain information is directly correlated to sample topography, and can also be acquired while applying external magnetic fields to the sample.

In conventional MFM, the cantilever is oscillated vertically, whereas in TR‑MFM this oscillation is replaced by an (essentially) horizontal one, creating a torsional mode. The tip selectively detects the field that has a force gradient parallel to the tip. These in‑plane force gradient components can be measured with the same resolution and signal‑to‑noise ratio as flexural modes at the same location, providing magnetic information complementary to conventional MFM.

Studies evaluating the use of TR‑MFM for imaging magnetic structures have shown its ability to obtain magnetic contrast free from topographic influence, with similar lateral resolution as standard MFM. When combined with standard MFM, TR‑MFM is especially useful for studying the 3D nature of magnetic field distributions, as it provides access to the lateral field information.

(clockwise from top left) Magnetic domains on perpendicular magnetization multilayer [Pt/Co/Pt]x25 (courtesy: K. Bouzehouane, Université Paris‑Saclay, Thales), and on magnetic tape. Scan sizes (X): 3.6 μm, 3.8 μm, 3 μm.
Input value is invalid.

Get instant access to the full-length AFM modes handbook.

The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

  • An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses
  • Detailed descriptions of 50+ modes and variants (including 300+ data images)
  • Summary information about what each mode is, how it works, and when to use it
  • Our experts' top probe recommendations for each mode
Please enter your first name
Please enter your last name
Please enter your e-mail address
Please enter a valid phone number
Please enter your Company/Institution
What best describes your current interest?
Please accept the Terms and Conditions

             Privacy Notice   Terms of Use


  * Please fill out the required fields.

Your download is now available.


Note:
If you exit this page, you may not be able to reopen this download window without re-submitting the form.