Atomic Force Microscope


Best place to start your AFM research


The compact Innova® atomic force microscope (AFM) delivers application flexibility for the most demanding scientific research at a moderate cost. Its unique closed-loop scan linearization system ensures accurate measurements and noise levels approaching those of open-loop operation. The integrated, high-resolution color optics, open stage, and software experiment selector make setting up each new experiment fast and easy. With its highly customizable feature set, Innova offers the utmost value for high-resolution imaging and a wide range of functionality in physical, life, and material sciences research.

high-resolution imaging
Ensures accurate measurements at all scales and in all dimensions.
setup and workflow
Delivers fast and precise characterization for experiments, from survey to atomic resolution.
research flexibility
Customizes experiments with full range of SPM modes and configurable signal access.

Streamlined Design

All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultralow-noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultralow-noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid.

Patented Top-Down Optics

With software-controlled optical zoom, Innova optics provide a broad range of magnification, allowing for a direct view of the cantilever and sample with better than 1-micron resolution to identify the smallest sample features and ensure precise probe positioning. With the optics positioned entirely inside the protective instrument cover, probe and sample can be viewed at any time while insolating the instrument from the environment. The ergonomic integration of the optics with the microscope also contributes to the ease and accuracy of tip exchange and laser alignment. The user can simply drop in a new tip and swing the optics back into place. The pre-aligned cantilever will always remain in focus.

High-resolution topography (orange) and phase image (green) reveal the microphase separation in a poly(styrene-b-butadiene-b-styrene) (SBS) triblock copolymer. 1k x 1k unfiltered raw data.Image size: 2 μm. Closed-loop scan linearization active.

Easy Sample Access

Scanning capacitance data of a silicon DRAM cell.

Innova provides excellent sample access, even when the microscope head is in place, without compromising the rigidity of the mechanical design. The physically open architecture offers greater flexibility for custom experiments, for example, by allowing the easy insertion of electrodes for electrical and electrochemical sample characterization.

AFM Modes

Expand Your Applications with AFM Modes

With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.


Hear What Our Customers Have to Say

We are extremely happy with the Bruker Innova AFM instrument. It is easy to operate and is very useful for both biophysics research and undergraduate biophysics teaching. Many students are using this instrument extensively, and they are getting some beautiful images of their samples.

Dr. Samrat Mukhopadhyay, Indian Institute of Science Education and Research (IISER), Mohali, Punjab, India

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