Patents
Bruker LSMS
Virtual patent marking for Bruker LSMS products and services pursuant to 35 U.S.C. § 287(a):
| Patent Title | Country | Issue Number |
|---|---|---|
| Multiple rod systems produced by wire erosion | US | US7351963B2 |
| Measurement of light fragment ions with ion traps | US | US7615742B2 |
| TOP-DOWN PROTEIN ANALYSIS IN MASS SPECTROMETERS WITH ION TRAPS | US | US7642509B2 |
| COLLISION-INDUCED DECOMPOSITION OF IONS IN RF ION TRAPS | US | US7847246B2 |
| ISOLATION OF IONS IN OVERLOADED RF ION TRAPS | US | US8324566B2 |
| Multiple rod systems produced by wire erosion | US | US7351963B2 |
| Ion fragmentation by electron transfer in ion traps | US | US7456397B2 |
| Measurement of light fragment ions with ion traps | US | US7615742B2 |
| FEEDBACK FRAGMENTATION IN ION TRAP MASS SPECTROMETERS | US | US7586089B2 |
| ION SOURCE FOR ELECTRON TRANSFER DISSOCIATION AND DEPROTONATION | US | US7582862B2 |
| TOP-DOWN PROTEIN ANALYSIS IN MASS SPECTROMETERS WITH ION TRAPS | US | US7642509B2 |
| COLLISION-INDUCED DECOMPOSITION OF IONS IN RF ION TRAPS | US | US7847246B2 |
| ISOLATION OF IONS IN OVERLOADED RF ION TRAPS | US | US8324566B2 |
| Biopolymer sequences by MALDI granddaughter ion spectra | US | US7396686B2 |
| Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7235781B2 |
| Laser systems for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7385192B2 |
| CALIBRATION CURVES FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US7851746B2 |
| AUTOMATIC CLEANING OF MALDI ION SOURCES | US | US7989762B2 |
| TARGETED PROTEIN CHARACTERIZATION BY MASS SPECTROMETRY | US | US10877044B2 |
| Method and apparatus for nano-capillary/micro electrospray for use in liquid chromatography-mass spectrometry | US | US8227750B1 |
| Determination of Tissue States by Imaging Mass Spectrometry | US | US8605968B2 |
| SAMPLE PREPARATION FOR MASS SPECTROMETRIC IMAGING | US | US7667196B2 |
| PREPARATION OF A MATRIX LAYER FOR MASS SPECTROMETRY | US | US8237113B2 |
| PREPARATION DEVICE FOR MASS-SPECTROMETRIC SAMPLES | US | US9121794B2 |
| Multiple rod systems produced by wire erosion | US | US7351963B2 |
| CALIBRATION CURVES FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US7851746B2 |
| ADJUSTING THE DETECTOR AMPLIFICATION IN MASS SPECTROMETERS | US | US8536519B2 |
| METHOD FOR OPERATING A TIME-OF-FLIGHT MASS SPECTROMETER WITH ORTHOGONAL ION PULSING | US | US8927928B2 |
| ACQUISITION OF FRAGMENT ION MASS SPECTRA OF BIOPOLYMERS IN MIXTURES | US | US9595427B2 |
| REFLECTORS FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US10026601B2 |
| Mass spectrometer and reaction cell for ion-ion reactions | US | US7196326B2 |
| Multiple rod systems produced by wire erosion | US | US7351963B2 |
| CALIBRATION CURVES FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US7851746B2 |
| ADJUSTING THE DETECTOR AMPLIFICATION IN MASS SPECTROMETERS | US | US8536519B2 |
| METHOD FOR OPERATING A TIME-OF-FLIGHT MASS SPECTROMETER WITH ORTHOGONAL ION PULSING | US | US8927928B2 |
| Alpha- and chi-diketone reactants for charge transfer reactions in mass spectrometers | US | US9557297B2 |
| ACQUISITION OF FRAGMENT ION MASS SPECTRA OF BIOPOLYMERS IN MIXTURES | US | US9595427B2 |
| REFLECTORS FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US10026601B2 |
| Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7235781B2 |
| CALIBRATION CURVES FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US7851746B2 |
| AUTOMATIC CLEANING OF MALDI ION SOURCES | US | US7989762B2 |
| LOW DEAD-VOLUME CONNECTOR FOR FLUID CHROMATOGRAPHY | US | US10551360B2 |
| LIQUID JUNCTION APPARATUS FOR ELECTROSPRAY IONIZATION | US | US10593532B2 |
| Biopolymer sequences by MALDI granddaughter ion spectra | US | US7396686B2 |
| Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7235781B2 |
| Laser systems for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7385192B2 |
| CALIBRATION CURVES FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US7851746B2 |
| ADJUSTING THE DETECTOR AMPLIFICATION IN MASS SPECTROMETERS | US | US8536519B2 |
| LASER SPOT CONTROL IN MALDI MASS SPECTROMETERS | US | US8872103B2 |
| MASS SPECTROMETER WITH LASER SPOT PATTERN FOR MALDI | US | US9741550B2 |
| BLANKING OUT OF PULSES IN PULSED LASERS FOR LDI MASS SPECTROMETERS | US | US10037878B2 |
| MAINTAINING SPECTRAL QUALITY OVER LONG MEASURING PERIODS IN IMAGING MASS SPECTROMETRY | US | US11081328B2 |
| CORRECTION OF ASYMMETRIC ELECTRIC FIELDS IN ION CYCLOTRON RESONANCE CELLS | US | US8859953B2 |
| Correction of asymmetric electric fields in ion cyclotron resonance cells | US | US8766174B1 |
| PHYSICAL-CHEMICAL PROPERTY SCORING FOR STRUCTURE IDENTIFICATION IN ION SPECTROMETRY | US | US12293907 |
| Biopolymer sequences by MALDI granddaughter ion spectra | US | US7396686B2 |
| Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7235781B2 |
| Laser systems for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7385192B2 |
| METHOD AND APPARATUS FOR ADJUSTING A SAMPLE-ION SOURCE ELECTRODE DISTANCE IN A TOF MASS SPECTROMETER | US | US7872226B2 |
| CALIBRATION CURVES FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US7851746B2 |
| AUTOMATIC CLEANING OF MALDI ION SOURCES | US | US7989762B2 |
| ADJUSTING THE DETECTOR AMPLIFICATION IN MASS SPECTROMETERS | US | US8536519B2 |
| ARRANGEMENT FOR A REMOVABLE ION-OPTICAL ASSEMBLY IN A MASS SPECTROMETER | US | US8642945B2 |
| ARRANGEMENT FOR A REMOVABLE ION-OPTICAL ASSEMBLY IN A MASS SPECTROMETER | US | US9087681B2 |
| LASER SPOT CONTROL IN MALDI MASS SPECTROMETERS | US | US8872103B2 |
| MASS SPECTROMETER WITH MALDI LASER SYSTEM | US | US8431890B1 |
| MASS SPECTROMETER WITH LASER SPOT PATTERN FOR MALDI | US | US9741550B2 |
| REFLECTORS FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US10026601B2 |
| BLANKING OUT OF PULSES IN PULSED LASERS FOR LDI MASS SPECTROMETERS | US | US10037878B2 |
| BLANKING OUT OF PULSES IN PULSED LASERS FOR LDI MASS SPECTROMETERS | US | US10037878B2 |
| Mass spectrometric differentiation of tissue states | US | US7873478B2 |
| Determination of Tissue States by Imaging Mass Spectrometry | US | US8605968B2 |
| NORMALIZATION OF MASS SPECTRA ACQUIRED BY MASS SPECTROMETRIC IMAGING | US | US10373813B2 |
| METHOD FOR COMPUTER-ASSISTED ANALYSIS OF ONE OR MORE TISSUE SECTIONS OF THE HUMAN OR ANIMAL BODY | US | US10304671B2 |
| MASS SPECTROMETRIC DETERMINATION OF TISSUE STATES | US | US11367600B2 |
| Peak width estimation in mass spectra | US | US11721534B2 |
| MASS SPECTROMETRIC DETERMINATION OF TISSUE STATES | US | US11705316B2 |
| Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7235781B2 |
| LASER SPOT CONTROL IN MALDI MASS SPECTROMETERS | US | US8872103B2 |
| MASS SPECTROMETER WITH LASER SPOT PATTERN FOR MALDI | US | US9741550B2 |
| BLANKING OUT OF PULSES IN PULSED LASERS FOR LDI MASS SPECTROMETERS | US | US10037878B2 |
| Multiple rod systems produced by wire erosion | US | US7351963B2 |
| Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7235781B2 |
| Ion fragmentation by electron transfer in ion traps | US | US7456397B2 |
| Laser systems for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7385192B2 |
| Determination of elemental composition of substances from ultrahigh-resolved isotopic fine structure mass spectra | US | US9111735B1 |
| CORRECTION OF ASYMMETRIC ELECTRIC FIELDS IN ION CYCLOTRON RESONANCE CELLS | US | US8859953B2 |
| Correction of asymmetric electric fields in ion cyclotron resonance cells | US | US8766174B1 |
| INTRODUCTION OF IONS INTO ION CYCLOTRON RESONANCE CELLS | US | US9355830B2 |
| SUPPRESSING HARMONIC SIGNALS IN ION CYCLOTRON RESONANCE MASS SPECTROMETRY | US | US10297433B2 |
| ICR-Messzelle mit einem Duplexer | US | US-9620349-BB |
| Multiple rod systems produced by wire erosion | US | US7351963B2 |
| CALIBRATION CURVES FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US7851746B2 |
| ADJUSTING THE DETECTOR AMPLIFICATION IN MASS SPECTROMETERS | US | US8536519B2 |
| METHOD FOR OPERATING A TIME-OF-FLIGHT MASS SPECTROMETER WITH ORTHOGONAL ION PULSING | US | US8927928B2 |
| Apparatus and method for parallel flow ion mobility spectrometry combined with mass spectrometry | US | US7838826B1 |
| APPARATUS AND METHOD FOR PARALLEL FLOW ION MOBILITY SPECTROMETRY COMBINED WITH MASS SPECTROMETRY | US | US8288717B2 |
| REFLECTORS FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US10026601B2 |
| TRAPPING ION MOBILITY SPECTROMETER WITH PARALLEL ACCUMULATION | US | US9683964B2 |
| Multiple rod systems produced by wire erosion | US | US7351963B2 |
| Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7235781B2 |
| Ion guides with RF diaphragm stacks | US | US7391021B2 |
| Laser systems for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7385192B2 |
| ADJUSTING THE DETECTOR AMPLIFICATION IN MASS SPECTROMETERS | US | US8536519B2 |
| METHOD FOR OPERATING A TIME-OF-FLIGHT MASS SPECTROMETER WITH ORTHOGONAL ION PULSING | US | US8927928B2 |
| Apparatus and method for parallel flow ion mobility spectrometry combined with mass spectrometry | US | US7838826B1 |
| APPARATUS AND METHOD FOR PARALLEL FLOW ION MOBILITY SPECTROMETRY COMBINED WITH MASS SPECTROMETRY | US | US8288717B2 |
| LASER SPOT CONTROL IN MALDI MASS SPECTROMETERS | US | US8872103B2 |
| MASS SPECTROMETER WITH LASER SPOT PATTERN FOR MALDI | US | US9741550B2 |
| REFLECTORS FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US10026601B2 |
| TRAPPING ION MOBILITY SPECTROMETER WITH PARALLEL ACCUMULATION | US | US9683964B2 |
| Ion guides with RF diaphragm stacks | US | US7391021B2 |
| Apparatus and method for parallel flow ion mobility spectrometry combined with mass spectrometry | US | US7838826B1 |
| APPARATUS AND METHOD FOR PARALLEL FLOW ION MOBILITY SPECTROMETRY COMBINED WITH MASS SPECTROMETRY | US | US8288717B2 |
| TRAPPING ION MOBILITY SPECTROMETER WITH PARALLEL ACCUMULATION | US | US9683964B2 |
| ACQUISITION OF FRAGMENT ION MASS SPECTRA OF IONS SEPARATED BY THEIR MOBILITY | US | US9891194B2 |
| TRAPPED ION MOBILITY SPECTROMETER WITH HIGH ION STORAGE CAPACITY | US | US10458944B2 |
| TRAPPED ION MOBILITY SPECTROMETER WITH HIGH ION STORAGE CAPACITY | US | US10989690B2 |
| Multiple rod systems produced by wire erosion | US | US7351963B2 |
| CALIBRATION CURVES FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US7851746B2 |
| ADJUSTING THE DETECTOR AMPLIFICATION IN MASS SPECTROMETERS | US | US8536519B2 |
| METHOD FOR OPERATING A TIME-OF-FLIGHT MASS SPECTROMETER WITH ORTHOGONAL ION PULSING | US | US8927928B2 |
| Apparatus and method for parallel flow ion mobility spectrometry combined with mass spectrometry | US | US7838826B1 |
| APPARATUS AND METHOD FOR PARALLEL FLOW ION MOBILITY SPECTROMETRY COMBINED WITH MASS SPECTROMETRY | US | US8288717B2 |
| REFLECTORS FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US10026601B2 |
| TRAPPING ION MOBILITY SPECTROMETER WITH PARALLEL ACCUMULATION | US | US9683964B2 |
| ACQUISITION OF FRAGMENT ION MASS SPECTRA OF IONS SEPARATED BY THEIR MOBILITY | US | US9891194B2 |
| Multiple rod systems produced by wire erosion | US | US7351963B2 |
| CALIBRATION CURVES FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US7851746B2 |
| ADJUSTING THE DETECTOR AMPLIFICATION IN MASS SPECTROMETERS | US | US8536519B2 |
| METHOD FOR OPERATING A TIME-OF-FLIGHT MASS SPECTROMETER WITH ORTHOGONAL ION PULSING | US | US8927928B2 |
| Apparatus and method for parallel flow ion mobility spectrometry combined with mass spectrometry | US | US7838826B1 |
| APPARATUS AND METHOD FOR PARALLEL FLOW ION MOBILITY SPECTROMETRY COMBINED WITH MASS SPECTROMETRY | US | US8288717B2 |
| REFLECTORS FOR TIME-OF-FLIGHT MASS SPECTROMETERS | US | US10026601B2 |
| TRAPPING ION MOBILITY SPECTROMETER WITH PARALLEL ACCUMULATION | US | US9683964B2 |
| ACQUISITION OF FRAGMENT ION MASS SPECTRA OF IONS SEPARATED BY THEIR MOBILITY | US | US9891194B2 |
| Biopolymer sequences by MALDI granddaughter ion spectra | US | US7396686B2 |
| Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7235781B2 |
| Laser systems for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis | US | US7385192B2 |
| AUTOMATIC CLEANING OF MALDI ION SOURCES | US | US7989762B2 |
For Research Use Only. Not for use in clinical diagnostic procedures.
Bruker Biospin
Virtual patent marking for Bruker Biospin products and services pursuant to 35 U.S.C. § 287(a):
| Title | Country code | Document number |
|---|---|---|
| Shim coils for a compact MRI gradient system based on multilayer flexible printed circuit boards and arrangement scheme of conductor layers | US | US12566227B2 |
| Holding of NMR measurement samples in a space-restricted NMR spectrometer | US | US12399239B1 |
| Split self-shielded gradient coil system, with power supply system for individually adjusting currents of sub-coil groups | US | US12366620B2 |
| Monitoring device for temperature-controlled capillary guidance having nested tubes and transport capillaries for NMR flow cells | US | US12429537B2 |
| Coupling device for an NMR flow cell | US | US11796444B2 |
| Method for obtaining a CT image of an object with heel effect compensation in image space | US | US11748859B2 |
| Reinforcement of a superconducting magnet coil | US | US11506736B2 |
| Magnetically compensated NMR rotor | US | US11073579B1 |
| System and method for provisional training data to enable a neural network to identify signals in NMR measurements | US | US12174280B2 |
| Microwave resonator for an EPR probehead providing Q-, M- and D-variation using a variable fluid volume | US | US11079457B2 |
| Solenoidal magnet section with integrated joints, in particular HTS-LTS joints, and associated magnet coil assembly | US | US11923132B2 |
| Imaging device, method for designing a circuit board arrangement, and circuit board arrangement | US | US11988731B2 |
| Temperature-control system for MR apparatuses with a permanent magnet arrangement | US | US11709214B2 |
| NMR probehead | US | US12000913B2 |
| NMR probehead | US | US12019129B2 |
| NMR shim system | US | US10481230B2 |
| NMR probe head with a backbone in the shielding tube | US | US10768248B2 |
| NMR-MAS probe head with pivotable stator | US | US10712410B2 |
| MPI method and system for visually representing MPI image data | US | US10782367B2 |
| MAS NMR probe head arrangement with replaceable stator | US | US10649047B2 |
| MAS-NMR rotor system with improved space utilization | US | US10830845B2 |
| Superconducting magnet coil system | US | US12106897B2 |
| Transport device for an NMR MAS rotor in a probe head (“MAS shuttle”) | US | US10746823B2 |
| NMR probe head comprising a releasable HF seal | US | US10203381B2 |
| Fastening device for an NMR probe having a quick-release fastener | US | US10379179B2 |
| NMR probe comprising a multi-part lower insert portion | US | US10473735B2 |
| Adjustment device for an RF resonant circuit of an NMR probe head | US | US10557899B2 |
| Spraying process for coating a substrate | US | US11241704B2 |
| EPR apparatus equipped with specific RS coils and corresponding coil devices | US | US10955512B2 |
| EPR resonator with extended transparency and homogeneity in RF range | US | US10656230B2 |
| Read network topology | US | US10838084B2 |
| High-frequency interface circuit, high-frequency system and magnet resonance apparatus with a high-frequency interface circuit | US | US10502798B2 |
| Magnet and cryostat arrangement, and method for passive shimming | US | US10060998B2 |
| Probehead of an NMR-MAS apparatus with a device for determining the angle between the MAS rotor and the static magnetic field | US | US9945654B2 |
| Probehead with adjustable angle for NMR-MAS apparatus | US | US10261143B2 |
| Easily accessible deep-frozen NMR shim arrangement | US | US9766312B2 |
| Needle guide with centering for septum piercing | US | US9687841B2 |
| Rapid quantification of components in solid mixtures of chemicals via time-domain NMR spectroscopy | US | US10697911B2 |
| Method for the determination of a spatial assignment or spatial distribution of magnetic particles | US | US9651637B2 |
| Method and device for the automatable determination of the limit of quantification and the relative error when quantifying the concentration of a substance to be investigated in a test sample | US | US10330613B2 |
| Method and device for precooling a cryostat | US | US10203068B2 |
| Method and device for precooling a cryostat | US | US12292163B2 |
| NMR transmitting/receiving coil configuration | US | US10310034B2 |
| Magnetic particle imaging method | US | US10016146B2 |
| EPR microwave cavity for small magnet airgaps | US | US10353027B2 |
| MAS-stator with suctioning-off device | US | US10132881B2 |
| ICR cell operating with a duplexer | US | US9620349B2 |
| Cooling device with cryostat and cold head having reduced mechanical coupling | US | US9982840B2 |
| X-ray CT apparatus with a filtering element exhibiting a maximum absorption at its center | US | US9649076B2 |
| Robust dynamical method and device for detecting the level of a liquid using resistance temperature detectors | US | US9810566B2 |
| Shuttle for an NMR MAS rotor | US | US9903923B2 |
| Shimming procedure that includes determination of the target field by optimization in a parameter space of reduced dimensionality | US | US9817097B2 |
| NMR probe head with improved centering of the sample vial | US | US9726735B2 |
| Ultra-low vibration cryogen-free cryostat for an electron paramagnetic resonance system | US | US11099247B2 |
| Electrical circuit in the magnetic field of an MR apparatus | US | US9606201B2 |
| NMR measuring configuration with temperature control device for a sample vial | US | US9482729B2 |
| Calibration method for an MPI(=Magnetic particle imaging) apparatus | US | US9965874B2 |
| Electronic interface for NMR receiver resonators | US | US9625554B2 |
| Cryogen-free cooling system for electron paramagnetic resonance system | US | US8610434B2 |
| Cryogenic probehead cooler in a nuclear magnetic resonance apparatus | US | US8975896B2 |
| Excitation light source assembly | US | US8901516B2 |
| Methods and systems for producing visible light and x-ray image data | US | US9347894B2 |
| Modular MRI phased array antenna | US | US8692553B2 |
| NMR reaction monitoring flow cell | US | US8686729B2 |
| NMR reaction monitoring flow cell | US | US9448192B2 |
| Temperature control device for an NMR sample tube | US | US8847595B2 |
| Designing a time dependency for a k-space trajectory, in particular a spiral | US | US8633696B2 |
| Methods and systems for collimating | US | US9177680B2 |
| Method for cryogenic cooling of an NMR detection system with the assistance of a container filled with a cryogenic fluid | US | US10228430B2 |
| Device for correcting set-point signals and system for the generation of gradients comprising such a device | US | US8736268B2 |
| Compact superconducting magnet configuration with active shielding, wherein the shielding coil damps the field maximum of the main coil as well as associated magnetic resonance tomograph, NMR spectrometer and ion cyclotron resonance mass spectrometer | US | US8154368B2 |
| Device for highly precise synchronization of the NMR transmission frequency to the resonance frequency of an NMR line while taking into consideration a non-constant RF phase | US | US8456165B2 |
| Adaptive closure with removable vent for sealing containers and method of use | US | US8098069B1 |
| Simultaneous excitation and acquisition in magnetic resonance | US | US8432165B2 |
| Method for mapping of the radio frequency field amplitude in a magnetic resonance imaging system using adiabatic excitation pulses | US | US8258786B2 |
| Magnetic field gradient generating system and method for reducing the noise level in NMR/MRI experiments | US | US8228064B2 |
| MRI coil design with volumetric trough-shaped coil elements | US | US9429634B2 |
| Automated transport device for NMR measuring samples, cryo-magnetic system with automated transport device, transport container for an automated transport device and method for conveying an NMR measuring sample | US | US8217655B2 |
| NMR-MAS probehead with integral transport conduit for an MAS-rotor | US | US8212559B2 |
| Method of positioning and aligning with precision, a small animal in order to conduct and perform MRI measurements | US | US8482278B2 |
| Sample frame for preparation of a plurality of sample vessels, in particular NMR sample tubes | US | US8312781B2 |
| NMR resonator configured as an insulated foil, conductively coated on both sides | US | US7795871B2 |
| Method for determining the absolute number of electron spins in a sample of extended size | US | US7586305B2 |
| Sample exchange device having a sample receptacle guided through a meandering path, in particular for an NMR spectrometer | US | US7764064B2 |
| Superconducting magnet arrangement with hysteresis free field coil | US | US7567158B2 |
| Method of and apparatus for in-situ measurement of changes in fluid composition by electron spin resonance (ESR) spectrometry | US | US7868616B2 |
| RF resonator system and method for tuning an RF resonator system | US | US7564244B2 |
| Vacuum container for cooled magnetic resonance probe head | US | US7514922B2 |
| Cooled NMR probe head with flexible cooled connecting conduit | US | US7501822B2 |
| Sample holder for holding and transporting a sample vial within an NMR apparatus and automatic supply device for the automated exchange of NMR sample vials and method of operation thereof | US | US7718135B2 |
| Method of and apparatus for in-situ measurement of degradation of automotive fluids and the like by micro-electron spin resonance (ESR) spectrometry | US | US7589529B1 |
| Method and device for the preparation of liquid samples in NMR spectroscopy using a combined titration and pH electrode | US | US8123921B2 |
| NMR probe head with heated housing | US | US7358735B2 |
| Electrically symmetric NMR coils with a plurality of windings connected in series | US | US7397246B2 |
| Superconducting magnet coil system with quench protection | US | US7330341B2 |
| Tubular capacitor with variable capacitance and dielectrically elongated inner electrode for NMR applications | US | US7394642B2 |
| Configuration for nuclear magnetic resonance imaging (MRI) with an MRI phantom | US | US7368912B2 |
| Matrix shim system with grouped coils | US | US7330031B2 |
| Method for producing MR (magnetic resonance) images of a moving object using navigator signals | US | US7689264B2 |
| Automated projection spectroscopy (APSY) | US | US7308365B2 |
| Method for carrying out a chemical reaction | US | US8709361B2 |
Bruker NANO
Virtual patent marking for Bruker NANO products and services pursuant to 35 U.S.C. § 287(a):
| Title | Products | Country | Patent Number |
|---|---|---|---|
| 2-D MEMS TRIBOMETER WITH COMB DRIVES | MEMS PI 95 TEM PicoIndenter | Japan | 6195948 |
| 2-D MEMS TRIBOMETER WITH COMB DRIVES | MEMS PI 95 TEM PicoIndenter | Netherlands | 2564180 |
| 2-D MEMS TRIBOMETER WITH COMB DRIVES | MEMS PI 95 TEM PicoIndenter | Switzerland | 2564180 |
| 2-D MEMS TRIBOMETER WITH COMB DRIVES | MEMS PI 95 TEM PicoIndenter | United Kingdom | 2564180 |
| 2-D MEMS TRIBOMETER WITH COMB DRIVES | MEMS PI 95 TEM PicoIndenter | United States | 9157845 |
| ACTUATABLE CAPACITIVE TRANSDUCER FOR QUANTITATIVE NANOINDENTATION COMBINED WITH TRANSMISSION ELECTRON MICROSCOPY | 3 Plate PI 95 TEM PicoIndenter | United States | 7798011 |
| ACTUATABLE CAPACITIVE TRANSDUCER FOR QUANTITATIVE NANOINDENTATION COMBINED WITH TRANSMISSION ELECTRON MICROSCOPY | 3 Plate PI 95 TEM PicoIndenter | United States | 8453498 |
| APPARATUS AND METHOD OF AMPLIFYING LOW VOLTAGE SIGNALS | IconIR; Multimode; Innova; Dimension Icon; Dimension Nexus; Dimension Fastscan | United States | 7886583 |
| CLOSED LOOP CONTROLLER AND METHOD FOR FAST SCANNING PROBE MICROSCOPY | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | China | ZL200880014968.2 |
| CLOSED LOOP CONTROLLER AND METHOD FOR FAST SCANNING PROBE MICROSCOPY | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | France | 2149030 |
| CLOSED LOOP CONTROLLER AND METHOD FOR FAST SCANNING PROBE MICROSCOPY | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Germany | DE602008051425.0 |
| CLOSED LOOP CONTROLLER AND METHOD FOR FAST SCANNING PROBE MICROSCOPY | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Japan | 5292391 |
| CLOSED LOOP CONTROLLER AND METHOD FOR FAST SCANNING PROBE MICROSCOPY | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Republic of Korea | 10-1462701 |
| CLOSED LOOP CONTROLLER AND METHOD FOR FAST SCANNING PROBE MICROSCOPY | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United Kingdom | 2149030 |
| CLOSED LOOP CONTROLLER AND METHOD FOR FAST SCANNING PROBE MICROSCOPY | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 8904560 |
| CLOSED LOOP CONTROLLER AND METHOD FOR FAST SCANNING PROBE MICROSCOPY | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9244096 |
| CLOSED LOOP CONTROLLER AND METHOD FOR FAST SCANNING PROBE MICROSCOPY | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9523707 |
| ENVIRONMENTAL CONDITIONING ASSEMBLY FOR USE IN MECHANICAL TESTING AT MICRON OR NANO-SCALES | xSol | Germany | DE602013020748.8 |
| ENVIRONMENTAL CONDITIONING ASSEMBLY FOR USE IN MECHANICAL TESTING AT MICRON OR NANO-SCALES | xSol | Japan | 5963955 |
| ENVIRONMENTAL CONDITIONING ASSEMBLY FOR USE IN MECHANICAL TESTING AT MICRON OR NANO-SCALES | xSol | Switzerland | 2861934 |
| ENVIRONMENTAL CONDITIONING ASSEMBLY FOR USE IN MECHANICAL TESTING AT MICRON OR NANO-SCALES | xSol | United Kingdom | 2861934 |
| ENVIRONMENTAL CONDITIONING ASSEMBLY FOR USE IN MECHANICAL TESTING AT MICRON OR NANO-SCALES | xSol | United States | 9829417 |
| FORCE MEASUREMENT WITH REAL-TIME BASELINE DETERMINATION | NanoIR3; NanoIR3s; IconIR; InsightIR; Multimode; Innova; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | China | ZL201480075041.5 |
| FORCE MEASUREMENT WITH REAL-TIME BASELINE DETERMINATION | NanoIR3; NanoIR3s; IconIR; InsightIR; Multimode; Innova; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | China | ZL201910054032.2 |
| FORCE MEASUREMENT WITH REAL-TIME BASELINE DETERMINATION | NanoIR3; NanoIR3s; IconIR; InsightIR; Multimode; Innova; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | France | 3077831 |
| FORCE MEASUREMENT WITH REAL-TIME BASELINE DETERMINATION | NanoIR3; NanoIR3s; IconIR; InsightIR; Multimode; Innova; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Germany | DE602014079746.6 |
| FORCE MEASUREMENT WITH REAL-TIME BASELINE DETERMINATION | NanoIR3; NanoIR3s; IconIR; InsightIR; Multimode; Innova; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United Kingdom | 3077831 |
| FORCE MEASUREMENT WITH REAL-TIME BASELINE DETERMINATION | NanoIR3; NanoIR3s; IconIR; InsightIR; Multimode; Innova; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9575090 |
| FORCE MEASUREMENT WITH REAL-TIME BASELINE DETERMINATION | NanoIR3; NanoIR3s; IconIR; InsightIR; Multimode; Innova; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9910064 |
| INDENTER ASSEMBLY | Performech, Performech II and Digital Controller | United States | 8631687 |
| INSTRUMENT CHANGING ASSEMBLY AND METHODS | Auto Probe Changer | United States | 9902027 |
| INSTRUMENT CHANGING ASSEMBLY AND METHODS FOR THE SAME | Auto Probe Changer | Japan | 6379197 |
| INSTRUMENT CHANGING ASSEMBLY AND METHODS FOR THE SAME | Auto Probe Changer | Malaysia | MY-175389 |
| INSTRUMENT CHANGING ASSEMBLY AND METHODS FOR THE SAME | Auto Probe Changer | Republic of Korea | 10-1712028 |
| INSTRUMENT CHANGING ASSEMBLY AND METHODS FOR THE SAME | Auto Probe Changer | Switzerland | 3027365 |
| INSTRUMENT CHANGING ASSEMBLY AND METHODS FOR THE SAME | Auto Probe Changer | United Kingdom | 3027365 |
| LOW DRIFT SCANNING PROBE MICROSCOPE | Dimension Nexus | France | 2548033 |
| LOW DRIFT SCANNING PROBE MICROSCOPE | Dimension Nexus | Germany | DE602011070289.0 |
| LOW DRIFT SCANNING PROBE MICROSCOPE | Dimension Nexus | Republic of Korea | 10-1807186 |
| LOW DRIFT SCANNING PROBE MICROSCOPE | Dimension Nexus | Republic of Korea | 10-1891940 |
| LOW DRIFT SCANNING PROBE MICROSCOPE | Dimension Nexus | United Kingdom | 2548033 |
| LOW DRIFT SCANNING PROBE MICROSCOPE | Dimension Nexus | United States | 8869310 |
| LOW DRIFT SCANNING PROBE MICROSCOPE | Dimension Nexus | United States | 9116168 |
| LOW DRIFT SYSTEM FOR A METROLOGY INSTRUMENT | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | Japan | 7317963 |
| LOW DRIFT SYSTEM FOR A METROLOGY INSTRUMENT | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | United States | 10900997 |
| LOW DRIFT SYSTEM FOR SCANNING PROBE MICROSCOPE | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | Taiwan | I838425 |
| METHOD AND APPARATUS FOR MONITORING MOVEMENT OF A SPM ACTUATOR | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | United States | 7631546 |
| METHOD AND APPARATUS OF AUTOMATIC SCANNING PROBE IMAGING | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | China | ZL200880115559.1 |
| METHOD AND APPARATUS OF AUTOMATIC SCANNING PROBE IMAGING | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Germany | DE602008052563.5 |
| METHOD AND APPARATUS OF AUTOMATIC SCANNING PROBE IMAGING | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Republic of Korea | 10-1536788 |
| METHOD AND APPARATUS OF AUTOMATIC SCANNING PROBE IMAGING | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 7865966 |
| METHOD AND APPARATUS OF ELECTRICAL PROPERTY MEASUREMENT USING AN AFM OPERATING IN PEAK FORCE TAPPING MODE | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | France | 2864798 |
| METHOD AND APPARATUS OF ELECTRICAL PROPERTY MEASUREMENT USING AN AFM OPERATING IN PEAK FORCE TAPPING MODE | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | France | 3293527 |
| METHOD AND APPARATUS OF ELECTRICAL PROPERTY MEASUREMENT USING AN AFM OPERATING IN PEAK FORCE TAPPING MODE | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | Germany | DE602013079912.1 |
| METHOD AND APPARATUS OF ELECTRICAL PROPERTY MEASUREMENT USING AN AFM OPERATING IN PEAK FORCE TAPPING MODE | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | Germany | 3293527 |
| METHOD AND APPARATUS OF ELECTRICAL PROPERTY MEASUREMENT USING AN AFM OPERATING IN PEAK FORCE TAPPING MODE | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | Republic of Korea | 10-1655051 |
| METHOD AND APPARATUS OF ELECTRICAL PROPERTY MEASUREMENT USING AN AFM OPERATING IN PEAK FORCE TAPPING MODE | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | Republic of Korea | 10-1991556 |
| METHOD AND APPARATUS OF ELECTRICAL PROPERTY MEASUREMENT USING AN AFM OPERATING IN PEAK FORCE TAPPING MODE | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | Switzerland | 2864798 |
| METHOD AND APPARATUS OF ELECTRICAL PROPERTY MEASUREMENT USING AN AFM OPERATING IN PEAK FORCE TAPPING MODE | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | Switzerland | 3293527 |
| METHOD AND APPARATUS OF ELECTRICAL PROPERTY MEASUREMENT USING AN AFM OPERATING IN PEAK FORCE TAPPING MODE | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | United Kingdom | 2864798 |
| METHOD AND APPARATUS OF ELECTRICAL PROPERTY MEASUREMENT USING AN AFM OPERATING IN PEAK FORCE TAPPING MODE | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | United Kingdom | 3293527 |
| METHOD AND APPARATUS OF ELECTRICAL PROPERTY MEASUREMENT USING AN AFM OPERATING IN PEAK FORCE TAPPING MODE | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | United States | 9869694 |
| METHOD AND APPARATUS OF ELECTRICAL PROPERTY MEASUREMENT USING AN AFM OPERATING IN PEAK FORCETAPPING MODE | IconIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan | United States | 9213047 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | China | ZL200980153270.3 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | China | ZL201080062939 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | China | ZL201510350667.9 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | France | 2359148 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | France | 2507642 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Germany | DE602009061828.8 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Germany | DE602010066511.9 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Japan | 6203494 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Japan | 6517888 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Japan | 6691900 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Malaysia | MY156153 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Malaysia | MY177892 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Republic of Korea | 10-1697993 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Republic of Korea | 10-1700473 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Republic of Korea | 10-1823954 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Republic of Korea | 10-1873936 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Republic of Korea | 10-1920606 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Republic of Korea | 10-1852475 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Republic of Korea | 10-1990916 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Singapore | 181154 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United Kingdom | 2359148 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United Kingdom | 2507642 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 8739309 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 8646109 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9322842 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9588136 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 11002757 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9274139 |
| METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9810713 |
| METHOD AND APPARATUS OF OPERATING SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 10502761 |
| METHOD AND APPARATUS OF OPERATING SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 10197596 |
| METHOD AND APPARATUS OF TUNING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | France | 2776851 |
| METHOD AND APPARATUS OF TUNING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Germany | DE602012080881.0 |
| METHOD AND APPARATUS OF TUNING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Netherlands | 2776851 |
| METHOD AND APPARATUS OF TUNING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Switzerland | 2776851 |
| METHOD AND APPARATUS OF TUNING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 8997259 |
| METHOD AND APPARATUS OF TUNING A SCANNING PROBE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9116167 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | China | ZL201180064557.6 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | China | ZL201510603771.4 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | France | 2646838 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Germany | DE602011063711.8 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | India | IN393945 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Japan | 6010040 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Japan | 6374461 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Netherlands | 2646838 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Russian Federation | RU-2571446 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United Kingdom | 2646838 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 8650660 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9291640 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9995765 |
| METHOD AND APPARATUS OF USING PEAK FORCE TAPPING MODE TO MEASURE PHYSICAL PROPERTIES OF A SAMPLE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 10663483 |
| METHOD AND APPARATUS TO COMPENSATE FOR DEFLECTION ARTIFACTS IN AN ATOMIC FORCE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | France | 311123 |
| METHOD AND APPARATUS TO COMPENSATE FOR DEFLECTION ARTIFACTS IN AN ATOMIC FORCE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Germany | DE602015091401.5 |
| METHOD AND APPARATUS TO COMPENSATE FOR DEFLECTION ARTIFACTS IN AN ATOMIC FORCE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | Republic of Korea | 10-2384301 |
| METHOD AND APPARATUS TO COMPENSATE FOR DEFLECTION ARTIFACTS IN AN ATOMIC FORCE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United Kingdom | 311123 |
| METHOD AND APPARATUS TO COMPENSATE FOR DEFLECTION ARTIFACTS IN AN ATOMIC FORCE MICROSCOPE | IconIR; InsightIR; Multimode; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9739799 |
| METHOD OF MEASURING AN INTERACTION FORCE | xProbe; MEMS PI 95 TEM PicoIndenter | United States | 9335240 |
| METHOD OF MEASURING PROPERTIES OF INTERFACIAL ADHESION | 3D OmniProbe | United States | 7628065 |
| MICRO ELECTRO-MECHANICAL HEATER | 400 C MEMS Heater | United States | 9759641 |
| MICRO/NANO-MECHANICAL TEST SYSTEM EMPLOYING TENSILE TEST HOLDER WITH PUSH-TO-PULL TRANSFORMER | Push-to-Pull Device | Switzerland | 2349913 |
| MICRO/NANO-MECHANICAL TEST SYSTEM EMPLOYING TENSILE TEST HOLDER WITH PUSH-TO-PULL TRANSFORMER | Push-to-Pull Device | Switzerland | 2790004 |
| MICRO/NANO-MECHANICAL TEST SYSTEM EMPLOYING TENSILE TEST HOLDER WITH PUSH-TO-PULL TRANSFORMER | Push-to-Pull Device | United Kingdom | 2349913 |
| MICRO/NANO-MECHANICAL TEST SYSTEM EMPLOYING TENSILE TEST HOLDER WITH PUSH-TO-PULL TRANSFORMER | Push-to-Pull Device | United Kingdom | 2790004 |
| MICRO/NANO-MECHANICAL TEST SYSTEM EMPLOYING TENSILE TEST HOLDER WITH PUSH-TO-PULL TRANSFORMER | Push-to-Pull Device | United States | 8434370 |
| MICRO/NANO-MECHANICAL TEST SYSTEM EMPLOYING TENSILE TEST HOLDER WITH PUSH-TO-PULL TRANSFORMER | Push-to-Pull Device | United States | 8789425 |
| MICROELECTROMECHANICAL TRANSDUCER AND TEST SYSTEM | xProbe; MEMS PI 95 TEM PicoIndenter | United States | 9404841 |
| MICROMACHINED COMB DRIVE FOR QUANTITATIVE NANOINDENTATION | xProbe; MEMS PI 95 TEM PicoIndenter | Japan | 6397424 |
| MICROMACHINED COMB DRIVE FOR QUANTITATIVE NANOINDENTATION | xProbe; MEMS PI 95 TEM PicoIndenter | Switzerland | 2310830 |
| MICROMACHINED COMB DRIVE FOR QUANTITATIVE NANOINDENTATION | xProbe; MEMS PI 95 TEM PicoIndenter | Switzerland | 2926111 |
| MICROMACHINED COMB DRIVE FOR QUANTITATIVE NANOINDENTATION | xProbe; MEMS PI 95 TEM PicoIndenter | United Kingdom | 2926111 |
| MICROMACHINED COMB DRIVE FOR QUANTITATIVE NANOINDENTATION | xProbe; MEMS PI 95 TEM PicoIndenter | United States | 8161803 |
| MICROMACHINED COMB DRIVE FOR QUANTITATIVE NANOINDENTATION | xProbe; MEMS PI 95 TEM PicoIndenter | United States | 9304072 |
| MICRON OR NANO-SCALE, THE MECHANICAL ASSEMBLY THE TESTING ENVIRONMENT CONDITIONING | xSol | Japan | 6247331 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Germany | DE602012074024.8 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Germany | DE602012024490.9 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Germany | DE602012062848.0 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Japan | 5678155 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Japan | 5678156 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Malaysia | MY173918 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Malaysia | MY174861 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Malaysia | MY180928 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Republic of Korea | 10-1386602 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Republic of Korea | 10-1535519 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Republic of Korea | 10-1438472 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Switzerland | 2673901 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Switzerland | 2762895 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | Switzerland | 2746721 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | United Kingdom | 2673901 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | United Kingdom | 2762895 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | United Kingdom | 2746721 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | United States | 8939041 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | United States | 8959980 |
| NANOMECHANICAL TESTING SYSTEM | ATI 8800, TI 950A and TI 950E | United States | 8770036 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | China | ZL201980052345.2 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | China | ZL202210389607.8 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | France | 3788386 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | Germany | 3788386 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | Japan | 7011739 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | Japan | 7062842 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | Japan | 7349529 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | Japan | 7654040 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | Republic of Korea | 10-2339797 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | United Kingdom | 3788386 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | United States | 11029330 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | United States | 11307220 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | United States | 11635449 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-NDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | United States | 11940461 |
| NANOSCALE DYNAMIC MECHANICAL ANALYSIS VIA ATOMIC FORCE MICROSCOPY (AFM-nDMA) | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | United States | 12241911 |
| SCANNING PROBE MICROSCOPE HAVING SUPPORT STAGE INCORPORATING A KINEMATIC FLEXURE ARRANGEMENT | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | China | ZL201080055160.6 |
| SCANNING PROBE MICROSCOPE HAVING SUPPORT STAGE INCORPORATING A KINEMATIC FLEXURE ARRANGEMENT | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | France | 2494367 |
| SCANNING PROBE MICROSCOPE HAVING SUPPORT STAGE INCORPORATING A KINEMATIC FLEXURE ARRANGEMENT | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | Germany | DE602010061467.0 |
| SCANNING PROBE MICROSCOPE HAVING SUPPORT STAGE INCORPORATING A KINEMATIC FLEXURE ARRANGEMENT | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | Japan | 5662464 |
| SCANNING PROBE MICROSCOPE HAVING SUPPORT STAGE INCORPORATING A KINEMATIC FLEXURE ARRANGEMENT | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | Republic of Korea | 10-1699111 |
| SCANNING PROBE MICROSCOPE HAVING SUPPORT STAGE INCORPORATING A KINEMATIC FLEXURE ARRANGEMENT | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | United Kingdom | 2494367 |
| SCANNING PROBE MICROSCOPE HAVING SUPPORT STAGE INCORPORATING A KINEMATIC FLEXURE ARRANGEMENT | IconIR; Dimension Icon; Dimension Nexus; Dimension Fastscan | United States | 8782810 |
| SCANNING PROBE MICROSCOPE WITH IMPROVED FEATURE LOCATION CAPABILITIES | IconIR; InsightIR; Dimension Icon; Dimension Nexus; Dimension Fastscan; InSight300; InSight AFP; Nanomet | United States | 9081028 |
| SURFACE EVALUATION EMPLOYING ORTHOGONAL FORCE MEASUREMENT | 3D OmniProbe | United States | 8186210 |
| TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE | PI 89 PI 88 and PI 87 SEM PicoIndenter | Czech Republic | 2761357 |
| TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE | PI 89 PI 88 and PI 87 SEM PicoIndenter | Germany | DE602012078722.8 |
| TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE | PI 89 PI 88 and PI 87 SEM PicoIndenter | Japan | 5789055 |
| TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE | PI 89 PI 88 and PI 87 SEM PicoIndenter | Japan | 6141918 |
| TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE | PI 89 PI 88 and PI 87 SEM PicoIndenter | Switzerland | 2761357 |
| TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE | PI 89 PI 88 and PI 87 SEM PicoIndenter | United Kingdom | 2761357 |
| TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE | PI 89 PI 88 and PI 87 SEM PicoIndenter | United States | 9472374 |
| TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE | PI 89 PI 88 and PI 87 SEM PicoIndenter | United States | 10663380 |
| TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE | PI 89 PI 88 and PI 87 SEM PicoIndenter | United States | 11237087 |
| TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE | PI 89 PI 88 and PI 87 SEM PicoIndenter | United States | 12140571 |
| TRANSITION TEMPERATURE MICROSCOPY | NanoIR3; NanoIR3s; IconIR; Multimode; Innova; Dimension Icon; Dimension Nexus; Dimension Fastscan | United States | 8177422 |