This webinar features exclusive presentations and Q&A with our guest speakers. Watch as they explore leading-edge techniques and instrumentation for AFM-based surface property mapping.
ON-DEMAND SESSION | 30 MINUTES
Bede Pittinger, Ph.D.
Senior Development Applications Specialist
ON-DEMAND SESSION | 20 MINUTES
Igor Sokolov, Ph.D.
Professor of Mechanical Engineering
Chief Technical Officer
Nanoscience Solutions Inc.
Bruker’s exclusive PeakForce Tapping® mode is arguably the most significant scientific breakthrough in atomic force microscope (AFM) technology since TappingMode™. It extends AFM measurements to a resolution and range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping.
This presentation explores recent advances and improvements in PeakForce Tapping technology and instrumentation. Features include:
Atomic force microscopy (AFM) is a well-established technique for probing the mechanical properties of materials at the nanoscale. For proper quantification of these mechanical measurements, non-resonant AFM modes have several important advantages, including clean separation of modulus vs adhesion. Specifically, Bruker’s PeakForce Tapping and AFM-nDMA modes provide quantitative and comprehensive measurements of elastic modulus and viscoelastic behavior of soft matter.
This presentation introduces Ringing Mode and discuss how this new mode extends PeakForce Tapping to enable, for the first time, enhanced surface adhesion property mapping.
Developed by Nanoscience Solutions Inc., Ringing Mode delivers 8 new quantitative compositional imaging channels that expand PeakForce QNM nanomechanical studies and provide unique insights into processes such polymer necking or the distribution and length of surface coating molecules. Integrated as a single operational mode on Bruker AFMs, Ringing Mode and PeakForce QNM together provide a comprehensive solution for nanoscale characterization of soft matter.
Bede Pittenger, Ph.D.
Bruker Nano Surfaces Sr. Staff Scientist, AFM Applications
Prof. Igor Sokolov, Mechanical Engineering Dept, Tufts University
Chief Technical Officer, Nanoscience Solutions Inc.