Trace Elements and Mineralization: The benefits of combining micro-XRF and SEM-EDS/WDS

This webinar took place on April 13, 2021

Overview

In many economic deposits the element or mineral of interest is a trace component.  However, the ability to identify these elements and minerals depends on how they occur.  Such information is important to understand the genesis of the deposit as well as the mineral and metallurgical processes to yield the maximum recovery.  Specifically, the examples shown will highlight the difference between a trace element and trace mineral and the analytical tools to best support the ultimate project goal.  

A combination of micro-XRF and SEM-EDS/WDS will expand your workflow analytical capabilities.  Micro-XRF is ideal to analyze large areas on the micro scale and is a powerful tool for identifying both trace elements or minerals, even directly from drill core samples.  In contrast, SEM analysis allows a higher spatial resolution required to understand the elemental and mineralogical processes at a high magnification.  The SEM-EDS/WDS combination allows analysis at high spectroscopic resolution, even for trace elements.  

The benefits and capabilities of each will be discussed to ultimately provide the best workflow for your analytical needs.  

There will be a 15-minute Q&A session where our experts will answer your questions.

Micro-XRF (M4 TORNADO) images - top: optical mosaic of 20 cm drill core, the white box is the area of analysis (18 cm x 4 cm); bottom: combined elemental map of Si, K, and Au.
Quantified Co map of a small (<100 µm) Co-bearing pyrite grain
AMICS mineralogical map of the grain showing the different pyrite classifications based on Co concentrations

Who should attend?

  • Geologists trying to understand ore genesis and processes
  • Metallurgists requiring information on the most appropriate mineral processing conditions to optimize recovery
  • Researchers from industry and academia who investigate economic mineralization

Speakers

Dr. Andrew Menzies

Senior Application Scientist Geology and Mining, Bruker Nano Analytics

Dr. Roald Tagle

Senior Application Scientist Micro-XRF, Bruker Nano Analytics

* The registration forms are optimized for the browser Google Chrome.