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▶ Watch On-Demand | 45 Minutes

On-Demand Access: Thin Film Characterization Using Spectroscopic Reflectometry and Ellipsometry Techniques

Learn more about the latest and most advanced spectroscopic reflectometry and ellipsometry techniques.

WATCH INDIVIDUAL SEGMENTS:

  • Introduction to Unique Reflectometry & Ellipsometry Techniques
  • What Makes Bruker's Filmtek Tools Unique?
  • Applications and Case Studies
Watch Now | 6 Minutes

Part 1: Introduction to Ellipsometry and Reflectometry Techniques

Watch Now | 15 Minutes

Part 2: Technologies That Make Filmtek Great

Watch Now | 10 Minutes

Applications and Case Studies

Featured Product and Technologies

OVERVIEW-filmtek

Spectroscopic Ellipsometry

Highly sensitive, repeatable measurement of single-layer thin films and small multilayer structures, capable of characterizing thickness and optical properties even on layers less than a single atomic layer thick
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OVERVIEW-filmtek

Spectroscopic Reflectometry

Expedited film thickness and optical constant measurements well suited for in-situ production quality assessment, particularly on thick films in development and production environments and semiconductor wafers
Read More
OVERVIEW-filmtek

Ellipsometry and Reflectometry Systems

High-accuracy film measurement well beyond the thickness range and refractive index resolution of traditional ellipsometers/reflectometers
Read More
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