On-Demand Session: Advancing Industrial Metrology Automation with Bruker's Dimension AFMs

_{PRESENTATION HIGHLIGHTS:}

• [00:00:20] Principle of 'Program Move'
• [00:02:26] Short Demo of Programmed Move
• [00:07:24] Dara Report Through Batch Process
• [00:09:05] Example of Progreammed Move on GaN Wafer

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:30] Key Features
• [00:02:45] User Interface: Operator
• [00:03:14] User Interface: Engineer
• [00:03:42] AutoMET video demonstration
• [00:05:28] AutoMET Recipe Types
• [00:14:18] Analysis
• [00:14:31] Automation is not Limited to Topography Modes
• [00:15:00] AutoMet: Summary

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] Challenges in AFM Automation
• [00:03:15] Bruker AFM Nanoscript Solution
• [00:05:48] Automating AFM Workflows using NanoScipt
• [00:13:34] Conclusion

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:00] For AutoMET, When you run a recipe live, Can you change the site list still while it's running? Or what are the constraints on that?
• [00:01:00] For AutoMET, Can you import CLAR files for the navigation?
• [00:01:45] Do you have online videos or application notes that go into more detail on the auto program portion, or the Program Move?
• [00:02:45] do you have documentation for NanoScript?
• [00:03:42] If you're looking at heterogeneities in different layers of thin films, any thoughts on what kind of automation you would use there?

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