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Rapid EBSD

An alternative to fast EBSD mapping

RAPID EBSD is a new and powerful ESPRIT 2 software package feature, based on a method developed at Imperial College in London, UK. It combines high quality ARGUSTM ForeScatter (FSE) images with state-of-the-art image segmentation algorithms and sparse EBSD/EDS data acquisition to reconstruct normal EBSD/EDS maps in the shortest time possible. 

Benefits: 

  • Increased efficiency
  • Fast mapping with long exposure times
  • Better statistics in EDS spectra
  • Less damage to beam sensitive samples
  • Reduced charging on non-conductive samples

Applications:

  • Grain size statistics
  • Crystallographic texture
  • Materials producing very weak diffraction signal
  • Beam sensitive samples
ARGUS ForeScatter (FSE) orientation contrast images of a 3d printed stainless steel specimen (Fig. 1a: low magnification).
ARGUS ForeScatter (FSE) orientation contrast images of a 3d printed stainless steel specimen (Fig. 1b: measured area)