Electron Microscope Analyzers


On-axis TKD for Unmatched Performance

Best Spatial Resolution

Low Probe Current Requirements

Effective spatial resolution
Unique on-axis TKD offers optimum sample-detector geometry resulting in unmatched performance
Maximum probe current required
On-axis TKD enables low probe current measurements without affecting speed and data quality
Ultrafast acquisition of FSE, BSE & STEM images
High contrast & low noise imaging within seconds enabled by unequaled ARGUS imaging system

Orientation Mapping of Nanomaterials with Unmatched Spatial Resolution

QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM. Here is why:

  • offers the best spatial resolution down to 1.5 nm 
  • operates with low probe currents without compromising speed and/or data quality 
  • the only TKD solution working in Ultra-High Resolution mode of SEMs using immersion lens technology 
  • fully automatic, built-in ARGUS imaging system

Why Do I Need On-axis TKD?

We would like to thank Aaron Lindenberg and his group at Stanford University for the permission to publish this DF-like image of their Ge-Sb-Te (GST) thin film sample!
  • To achieve the best spatial resolution 
  • For orientation and phase mapping in an SEM 
  • For fast mapping without compromising data quality/integrity 
  • For acquisition of STEM like images with excellent contrast and resolution at incredible speeds and with fully automatic signal optimization
  • For analyzing beam sensitive materials using low probe currents.

Resources & Publications