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Electron Microscope Analyzers

QUANTAX EBSD

On-axis TKD for Unmatched Performance

Best Spatial Resolution

Low Probe Current Requirements

QUANTAX EBSD eFlashHD BRUKER

Destaques

1.5
nm
Effective spatial resolution
Unique on-axis TKD offers optimum sample-detector geometry resulting in unmatched performance
2
nA
Maximum probe current required
On-axis TKD enables low probe current measurements without affecting speed and data quality
125,000
pps
Ultrafast acquisition of FSE, BSE & STEM images
High contrast & low noise imaging within seconds enabled by unequaled ARGUS imaging system

Orientation Mapping of Nanomaterials with Unmatched Spatial Resolution

QUANTAX EBSD system, with its popular OPTIMUS TKD detector head, is the best available solution for analyzing nanomaterials in the SEM. Here is why:

  • offers the best spatial resolution down to 1.5 nm 
  • operates with low probe currents without compromising speed and/or data quality 
  • the only TKD solution working in Ultra-High Resolution mode of SEMs using immersion lens technology 
  • fully automatic, built-in ARGUS imaging system

Benefícios

Why Do I Need On-axis TKD?

We would like to thank Aaron Lindenberg and his group at Stanford University for the permission to publish this DF-like image of their Ge-Sb-Te (GST) thin film sample!
  • To achieve the best spatial resolution 
  • For orientation and phase mapping in an SEM 
  • For fast mapping without compromising data quality/integrity 
  • For acquisition of STEM like images with excellent contrast and resolution at incredible speeds and with fully automatic signal optimization
  • For analyzing beam sensitive materials using low probe currents.

Mais informações

Resources & Publications