Dimension IconIR
Dimension IconIR
Bruker’s large-sample Dimension IconIR™ system combines nanoscale infrared (IR) spectroscopy and scanning probe microscopy (SPM) on one platform to deliver the most advanced spectroscopy, imaging, and property mapping capabilities available for academic researchers and industrial users. Incorporating decades of research and technological innovation, IconIR provides unrivaled performance based on and building off the industry-best AFM measurement capabilities of the Dimension Icon®. The system enables correlative microscopy and chemical imaging with enhanced resolution and monolayer sensitivity, while its unique large-sample architecture provides ultimate sample flexibility for the broadest range of applications. For example, the new IconIR polymer solution is an all-in-one package designed to include everything one would need to address key polymer research needs.
The Dimension IconIR platform has the highest performance in the world for AFM-IR measurements, leveraging advancements in IR laser sources, system designs, and operating modes. Read the application note "High-Performance Nanoscale IR Spectroscopy and Imaging with Dimension IconIR" to learn more.
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First-and-Only nanoIR Capabilities and Performance
In a single system, IconIR provides the highest performance for nanoscale infrared spectroscopy, chemical imaging resolution, and monolayer sensitivity.
Only Dimension IconIR delivers:
- High-performance nanoIR spectroscopy with accurate and repeatable FTIR correlation, <5 nm chemical resolution, and monolayer sensitivity
- Correlative chemical imaging with PeakForce Tapping® nanomechanical and nanoelectrical modes
- Highest Performance AFM imaging and unmatched sample flexibility with large-sample accommodation*
- The broadest available range of coordinating applications accessories and AFM modes, including the new Surface Sensitive AFM-IR Mode
*The standard system supports samples up to 150 mm, with versions capable of accommodating larger samples also available.
Most Complete Correlative Microscopy
Together with Bruker-exclusive PeakForce Tapping nanoscale property mapping and proprietary nanoIR spectroscopy technology, the Dimension IconIR system's large-sample platform is uniquely well-suited for correlative studies of materials and active nanoscale systems in electrical or chemically reactive environments—even complex systems with strong mechanical heterogeneities.
IconIR delivers:
- Advanced quantitative property mapping techniques
- The most complete correlative microscopy solution for quantitative nanochemical, nanomechanical, and nanoelectrical characterization
Highest Performance NanoIR Spectroscopy
Bruker is the innovator for photothermal AFM-IR-based nanoIR spectroscopy with our patented, unique suite of nanoIR modes. These modes enable IconIR to provide high-speed, high performance spectra that correlate to FTIR spectroscopy. The variety of modes support the measurement of a wide range of samples for both industrial and academic users.
IconIR delivers:
- Highest performance, rich, detailed spectra with FTIR correlation achieving single molecular spectroscopy
- Resonance-enhanced AFM-IR, the preferred technique for the nanoIR community, with the largest number of scientific publications
- Highest performance Tapping AFM-IR spectroscopy equivalent to Resonance-Enhanced AFM-IR
Highest Resolution Chemical Imaging
The Icon’s industry-leading AFM performance and Bruker’s patented Tapping AFM-IR imaging together enhance the spatial resolution and sample accessibility of our nanoIR technology, extending its application to segments not currently addressed by the photothermal AFM-IR technique.
IconIR provides:
- <5 nm chemical spatial resolution for imaging over a broad range of sample types, including soft samples
- Monolayer sensitivity for imaging of thin films and biological structure
- Consistent, reliable, and high-quality publishable data
- Reliable surface sensitive chemical measurements for polymeric films
Chemical Insights Into the Very Top Surface Layer
Utilizing Bruker’s new patented Surface Sensitive AFM-IR Mode, IconIR significantly decreases chemical probing depth from greater than 500 nanometers to tens of nanometers, while eliminating the need for cross-sectioning to seamlessly combine high spatial resolution and high surface sensitivity chemical imaging.
Frequently Asked Questions
Dimension IconIR supports Tapping AFM-IR and Resonance Enhanced AFM-IR as standard modes. Surface Sensitive AFM-IR and REFV AFM-IR are available as options, depending on the system’s configuration and accessories.
IconIR supports samples up to 150 millimeters in diameter and is designed for either multiple coupons or large-sample workflows. Bruker also has the Dimension IconIR 300 for full access on 200 mm and 300 mm wafers. If you need to work with larger or heavier samples, consult Bruker for custom solutions.
Standard Dimension Icon AFMs cannot be routinely upgraded to IconIR systems. IconIR is a dedicated platform with integrated IR capability.
More About Bruker's Nanoscale Infrared Technology
Yes. Bruker’s photothermal AFM-IR technology produces spectra that are directly comparable to FTIR spectra, as demonstrated in published documentation and peer-reviewed articles. AFM-IR spectra can be searched directly against FTIR spectral databases. If FTIR-like spectral analysis is critical for your application, our experts can provide evidence showing spectral correlation.
Photothermal AFM-IR provides direct absorption-based spectra that closely match FTIR results and are easier to interpret than Raman-AFM or s-SNOM. Further, Photothermal AFM-IR signals are amplified by the resonant enhancement of the cantilever providing the best signal-to-noise of those techniques. Bruker offers s-SNOM as a separate option for advanced near-field studies.
Bruker nanoIR systems routinely achieve chemical imaging with spatial resolution below 10 nm and can detect single molecular layers. Actual performance depends on your sample and selected measurement mode.
Yes, photothermal AFM-IR can chemically map and identify particles smaller than one micron, including nanoplastics and environmental contaminants. Direct correlation to FTIR provides ready interpretation in particles as small as 10 nm.
Bruker’s photothermal AFM-IR systems typically require a single socket of standard electrical power,and CDA. Specific requirements may vary by model, so request a site preparation guide from your Bruker representative.
Bruker photothermal AFM-IR systems primarily use quantum cascade lasers (QCLs) that deliver stable, reliable performance and broad coverage across the mid-infrared fingerprint region as well as optical parametric oscillators (OPOs) for the C-H, O-H, N-H stretching region. Multiple QCL chips can be combined to access all key spectral windows required for routine and advanced research, and additional sources are available for specialized applications. Bruker’s application experts can help you select the optimal laser configuration to match your measurement needs and ensure sufficient spectral resolution for both standard and demanding experiments.
Measurement times vary by application, but point spectra can be acquired in seconds, chemical maps in minutes, and automated recipes can be tailored for high-throughput workflows.
Routine maintenance includes probe replacement, laser alignment checks, and calibration with reference samples. Bruker provides detailed maintenance protocols and support plans.