Nanomechanical Testing Application Notes

Ultimate Solution for Ultra-Thin-Film Systems

Read about Bruker's solutions for the quantitative determination of the elastic properties of the ultra-thin-film systems

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Reliably Measure the Mechanical Properties of Thin Films

Readers can expect to learn more about the mechanical property measurement capabilities of Bruker's Hysitron TriboIndenter systems when an xProbe™ is equipped and the Intrinsic Thin Film Property Solution (iTF) analysis is applied. This application note focuses on the execution and outcomes of a nanoindentation experiment on an ultra-thin-film sample using this configuration.


KEYWORDS: Elastic Modulus; Mechanical Property Characterization; Quasi-Static Nanoindentation; Thin Film Metrology; Ultra-Thin-Film Metrology

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