Application Training

Texture and Residual Stress Analysis (W/Th)

This training course will show the different methods used for orientation and residual stress measurement and analysis, including the DIFFRAC.TEXTURE and DIFFRAC.LEPTOS S software packages. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the X-ray Powder Diffraction or 2 Dimensional Diffraction course.

Date:

No dates scheduled

Time:

9am-4pm CT

Details:

Location:

Further Information

Location

Language

English

Class size

Because our courses are interactive and learner-oriented, we limit class size to a minimum of three and a maximum of six. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis.

 

Attendance fee

The course fee is $1,700 USD per attendee per two-day session.

Contact

For further information about the course content, please contact:

Ben Krueger
Applications Scientist, XRD

For information about price, registration, or other questions:

Caitlin Heitman
Marketing Specialist

For a quotation, please contact: