Beyond Surface Roughness: From Millimeter to Nano Scale – Can We Predict Surface Behavior?
Explore Bruker's Solutions for Understanding Surface Behavior
Bruker experts and special guest speaker Prof. Maxence Bigerelle (CNRS, University of Valenciennes, France) discuss and provide practical guidance for researchers performing surface roughness measurements from nanometer to micron and millimeter scale. Special attention is paid to:
- Important parameters for measuring surface roughness
- Key industrial standards, e.g., ISO 25178,; and
- The importance of scale when choosing a method of analysis.
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Featured Products and Technology
LIVE DEMONSTRATION | 15 MINUTES
Measuring Roughness from the Micron to Millimeter Scale – Featuring Bruker’s ContourX-500 Optical Profilometer
Presented by Vishal Panchal, Ph.D., EMEA Applications Scientist, Bruker
LIVE DEMONSTRATION | 15 MINUTES
Measuring Roughness on the Nanometer Scale – Featuring Bruker’s Dimension XR AFM
Presented by Vishal Panchal, Ph.D., EMEA Applications Scientist, Bruker
Featured Presentations
Surface texture plays a key role in product development and the manufacturing industry.
It affects the performance and reliability of products ranging from automobile components to consumer electronics, photovoltaics, and space applications.
Roughness is the most common parameter used to characterize surface texture. Consequently, precise surface roughness analysis is integral for both manufacturing process optimization and improving product quality.
EXPERT-LED PRESENTATION | 20 MINUTES
Measuring Surface Roughness: ISO25178 Parameters Overview, Rules for Success
Mickael Febvre, Ph.D., Applications Manager, Bruker Nano EMEA
EXPERT-LED PRESENTATION | 30 MINUTES
Selecting the Relevant Scales of Topography
Prof. Maxence Bigerelle, Ph.D., CNRS, University of Valenciennes, France
Prof Maxence Bigerelle, a renowned expert in the field of surface roughness and functional impact, will talk on multiscale analysis, the importance of scale in process monitoring, and the most relevant roughness parameters.
Speakers
With introduction, live Q&A, and closing remarks led by: Emmanuel Paris, Sales Manager, Bruker EMEA
Mickael Febvre, Ph.D.
Application Manager, Bruker EMEA
Prof. Maxence Bigerelle, Ph.D.
CNRS, University of Valenciennes, FranceMaxence Bigerelle is Professor at the University of Valenciennes at LAMIH UMR CNRS 8201. He is an Engineer in Computer Science and did his Ph.D. in Mechanics and the Ability to Direct Research in Physical Science. He joined the R&D department at Arcelor before moving to Arts et Métiers School (UMR CNRS UMR 8207), after which he joined the University of Compiègne where he headed the Materials Department (52 people, UMR CNRS 5253). He then moved to the LAMIH where he currently directs the Mechanical Department (120 people) and the Morpho-Mechanical Research Axis (27 people).
Prof. Bigerelle is the author of over 150 international publications. His research activities concern the characterization of rough surfaces and the study of their physical properties to increase their functionalities (optical, mechanical, chemical, tribological, biological, sensory ...) as a result of their structure. He currently leads the Carnot Institutes 'Surfaces Structuring Challenge’, which brings together almost a hundred laboratories and technology transfer organizations. He is the leader of the GDR CNRS SurfTopo, a research group that gathers together laboratories and industrial companies working on the advancement of surface topography.
Vishal Panchal, Ph.D.
EMEA Applications Scientist, Bruker
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