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Beyond Surface Roughness: From Millimeter to Nano Scale – Can We Predict Surface Behavior?

Gain new insights into leading-edge techniques for surface roughness measurement in industrial applications.

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Learn how to optimize manufacturing processes and improve product quality.

Enhanced surface roughness characterization has the potential to improve the performance and reliability of products across industries.

Viewers can expect to:

Understand how to conduct precise surface roughness analyses using AFM and optical profiler instruments.
Receive practical guidance regarding important surface roughness parameters and key industrial standards.
See live demonstrations of Bruker's ContourX-500 Optical Profilometer and Dimension XR AFM.

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Explore Bruker's Solutions for Understanding Surface Behavior

Bruker experts and special guest speaker Prof. Maxence Bigerelle (CNRS, University of Valenciennes, France) discuss and provide practical guidance for researchers performing surface roughness measurements from nanometer to micron and millimeter scale. Special attention is paid to:

Important parameters for measuring surface roughness
Key industrial standards, e.g., ISO 25178,; and
The importance of scale when choosing a method of analysis.

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Featured Presentations

Surface texture plays a key role in product development and the manufacturing industry.

It affects the performance and reliability of products ranging from automobile components to consumer electronics, photovoltaics, and space applications.

Roughness is the most common parameter used to characterize surface texture. Consequently, precise surface roughness analysis is integral for both manufacturing process optimization and improving product quality.

_{EXPERT-LED PRESENTATION | 20 MINUTES}

Measuring Surface Roughness: ISO25178 Parameters Overview, Rules for Success

Mickael Febvre, Ph.D., Applications Manager, Bruker Nano EMEA

_{EXPERT-LED PRESENTATION | 30 MINUTES}

Selecting the Relevant Scales of Topography

Prof. Maxence Bigerelle, Ph.D., CNRS, University of Valenciennes, France

Prof Maxence Bigerelle, a renowned expert in the field of surface roughness and functional impact, will talk on multiscale analysis, the importance of scale in process monitoring, and the most relevant roughness parameters.

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Speakers

With introduction, live Q&A, and closing remarks led by: Emmanuel Paris, Sales Manager, Bruker EMEA

Mickael Febvre, Ph.D.
Application Manager, Bruker EMEA

Prof. Maxence Bigerelle, Ph.D.
CNRS, University of Valenciennes, France

Maxence Bigerelle is Professor at the University of Valenciennes at LAMIH UMR CNRS 8201. He is an Engineer in Computer Science and did his Ph.D. in Mechanics and the Ability to Direct Research in Physical Science. He joined the R&D department at Arcelor before moving to Arts et Métiers School (UMR CNRS UMR 8207), after which he joined the University of Compiègne where he headed the Materials Department (52 people, UMR CNRS 5253). He then moved to the LAMIH where he currently directs the Mechanical Department (120 people) and the Morpho-Mechanical Research Axis (27 people).

Prof. Bigerelle is the author of over 150 international publications. His research activities concern the characterization of rough surfaces and the study of their physical properties to increase their functionalities (optical, mechanical, chemical, tribological, biological, sensory ...) as a result of their structure. He currently leads the Carnot Institutes 'Surfaces Structuring Challenge’, which brings together almost a hundred laboratories and technology transfer organizations. He is the leader of the GDR CNRS SurfTopo, a research group that gathers together laboratories and industrial companies working on the advancement of surface topography.

Vishal Panchal, Ph.D.
EMEA Applications Scientist, Bruker

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Bruker's materials research atomic force microscopes, powered exclusively by PeakForce Tapping® technology, are helping researchers advance new nanomechanical, nanoelectrical, and nanoelectrochemical research, on the order of three peer-reviewed published articles per day.

Beyond Surface Roughness: From Millimeter to Nano Scale – Can We Predict Surface Behavior?

Submit the Form for Instant, Full-Length Access

Learn how to optimize manufacturing processes and improve product quality.

Explore Bruker's Solutions for Understanding Surface Behavior

Featured Products and Technology

Measuring Roughness from the Micron to Millimeter Scale – Featuring Bruker’s ContourX-500 Optical Profilometer

ContourX-500

Measuring Roughness on the Nanometer Scale – Featuring Bruker’s Dimension XR AFM

Dimension XR