Handheld XRF instruments have become a staple in the toolkit used by cultural heritage professionals and researchers the world over. Non-invasive major, minor and trace elemental analysis in an ultra-portable package allows much to be learned about a wide range of culturally important objects, without the need for sub-sampling, or worse, sample destruction.
In the first of our series on using handheld XRF in cultural heritage studies, this webinar will provide an introduction (or refresher!) to the fundamental concepts of XRF and how appropriate handling of your handheld instrument is key to robust and accurate results. The webinar will cover how the instrument generates a beam and measures resulting characteristic X-rays, and how modifying different parameters in this process allows the user to maximize successful compositional characterization.
Senior Lecturer & Coordinator - University of Pretoria, South Africa
Dr. Nigel Kelly
Senior Market Application Scientist, Bruker Nano Analytics
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