PhaseImaging™ is a secondary imaging mode derived from TappingMode™ that detects variations in composition, adhesion, friction, viscoelasticity, and other properties, including electric and magnetic. Applications include contaminant identification and mapping components of composite materials.
Phase imaging maps the phase lag between the periodic signal driving the cantilever and the oscillations of the cantilever. Changes in phase lag often indicate changes in the properties of the sample surface. Images of topography and material properties can be collected simultaneously.
Phase imaging is a key element in a number of AFM techniques, including Magnetic Force Microscopy (MFM), Electric Force Microscopy (EFM), and Scanning Capacitance Microscopy (SCM).