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Atomic Force Microscopy for Materials E-Book Download

Learn about the fundamental elements and advantages of AFM-based material characterization and how Bruker's AFM technology provides faster imaging and a larger selection of modes.


Submit the form to gain instant full-length access to chapters on:

  • The history, advantages, and constraints of atomic force microscopy (AFM), particularly for surface characterization of material samples.
  • The standard components, primary AFM imaging modes, and main secondary modes of contemporary AFM systems.
  • How to operate a typical AFM instrument, including sample preparation and tip selection.
  • How to leverage advances in AFM technology to navigate the challenges of studying inorganic materials.
  • Case studies of practical applications of AFM in industry-leading materials research.


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