High-Resolution Measurement of Film Thickness and Refractive Index for Silicon Photonics and Planar Waveguide Applications
Discover state-of-the-art methodologies and their practical implications
In this webinar, a Bruker expert presents a comprehensive overview of state-of-the-art film thickness and refractive index measurement techniques, including multi-angle spectroscopic reflectometry and ellipsometry. The included information is relevant for those who work with coatings, detectors, materials, nanophotonics, and spectroscopy in numerous industries such as aerospace, communications, energy, medical, and semiconductors.
After watching this webinar, viewers will:
- Understand the multi-angle spectroscopic reflectometry and ellipsometry techniques,
- Be able to identify advantages, limitations, and suitability of each technique for different multi-layer photonic structures, and
- Recognize the critical importance of high-resolution film thickness and refractive index measurement techniques.
Webinar Summary
Silicon photonics and planar waveguide technologies have become integral components in the rapidly evolving landscape of optical communication, sensing, and integrated photonics. Planar waveguides are the building blocks of numerous photonic components, such as modulators, detectors, multiplexers, and switches. The precise characterization of film thickness and refractive index within these structures is paramount for optimizing device performance.
This webinar provides an overview of advanced measurement technologies tailored to meet the high-resolution demands of silicon photonics and planar waveguide applications. Lawrence Rooney of Bruker shares about state-of-the-art film thickness and refractive index measurement techniques, including multi-angle spectroscopic reflectometry and ellipsometry, and discusses their respective advantages, limitations, and suitability for different types of multi-layer photonic structures. He also highlights the critical importance of high-resolution film thickness and refractive index measurement techniques in the advancement of silicon photonics and planar waveguide applications. By providing a comprehensive overview of state-of-the-art methodologies and their practical implications, this presentation serves as a valuable resource for researchers, engineers, and scientists working in the field of silicon photonics and planar waveguides, facilitating the development of next-generation photonic devices with enhanced performance and functionality.
This webinar will be most valuable for R&D scientists, engineers, manufacturers, and researchers who work with silicon photonics and planar waveguides, as well as optical scientists who perform test and measurement.
Find out more about the technology featured in this webinar and our industry-leading FilmTek thin film measurement tools:
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Speaker
Lawrence Rooney, Senior Application Scientist, Bruker
