On-Demand Session: High-Performance Photothermal AFM-IR for Novel Nanoscale Chemical Analysis
Learn about the capabilities of the photothermal AFM-IR technique using Bruker’s Dimension IconIR platform.
PRESENTATION HIGHLIGHTS:
- [00:02:33] Introduction to Bruker AFM-IR (Technology, Modes, Products)
- [00:13:45] High Sensitivity (<1 nm on metal substrate)
- [00:29:05] High-Spatial Resolution (<2 nm)
- [00:43:10] Controlled probing depth and surface sensitivity
- [00:50:23] High Measurement Speed (high IR Imaging rate, fast spectroscopy/hyperspectral)
- [00:55:02] Artifact-free (mechanical compensation with PLL)
- [00:57:52] Correlative study (Mechanical, thermal, electrical, magnetic)
Q&A
PRESENTATION HIGHLIGHTS:
- [00:00:00] What is the baseline noise level, and how to optimize tapping conditions to enhance the sensitivity?
- [00:02:20] How long does it take to acquire hyperspectral images?
