On-Demand Session: Cutting Edge Imaging: Harnessing Diamond Probes for Advanced AFM Performance

 _{PRESENTATION HIGHLIGHTS:}

[00:00:40] Why Diamond as Tip Material?

[00:01:23] Diamond Tip Technologies

[00:02:25] Single Crystal diamond tips mounted on cantilevers

[00:03:05] CVD diamond coatings on Si tips

[00:04:35] Sharpened Single-Crystal Diamond Tips

[00:05:30] Sharpened / Shaped Single-Crystal Diamond Tips

 _{PRESENTATION HIGHLIGHTS:}

[00:00:11] Atomic Resolution in Vaccum

[00:01:58] Atomic Resolution in Air

[00:04:30] Low-roughness samples

[00:07:37] Cantilever Based Nano Indentation

[00:09:27] Nano Indentation on Polycarbonate Sample

[00:10:40] Nano Indentation Practical Aspects

[00:11:50] Nano Indentation Examples

[00:13:00] PeakForce QNM

[00:15:30] Contact Resonance Mapping

 _{PRESENTATION HIGHLIGHTS:}

[00:00:47] Scanning Spreading Resistance Microscopy

[00:04:50] Conductive AFM

[00:07:20] PeakForce TUNA

[00:08:06] Scanning Capacitance Microscopy (SCM)

[00:10:55] KPFM

[00:11:30] Piezoresponse Force Microscopy (PFM)

[00:12:27] Material Removal (Scalpel)

[00:14:45] Scalpel AFM

[00:16:00] Scalpel C-AFM (or Tomographic C-AFM)

[00:17:24] Scalpel SSRM

 _{PRESENTATION HIGHLIGHTS:}

[00:00:00] If probe tips are being damaged or contaminated while scanning a rubber carbon black silica composite, would diamond probes help mitigate this issue?

[00:02:00] What is the best method for cleaning contaminated tips?

[00:04:05] Are these tips usable for living materials? What is the minimum force you can apply?