Knowledge Pack: Thin Film Characterization with AFM
Get instant, all-in-one access to technical resources exploring AFM methods for measuring nanoscale structure-property relationships in thin films, including how techniques are selected, applied, and interpreted in real-world workflows.
This knowledge pack includes:
- 2 full-length webinars introducing AFM fundamentals and exploring structure-property relationships in thin film systems
- 3 application notes explaining property mapping methods and how they are applied to thin films and coatings
- 2 expert-led video lectures focused on specific thin film use cases and measurement approaches
- 3 real-time demos showing how nanoscale measurements are performed and how thin film properties are interpreted
+ on-demand access to all presentations from our Thin Films & Coatings Symposium
Thin Film Characterization with Atomic Force Microscopy
Atomic force microscopy (AFM) enables nanoscale characterization of thin films and coatings by directly measuring surface structure and local material properties. It is used to evaluate variations in mechanical, electrical, and other functional behaviors that influence thin film performance and reliability. This knowledge pack brings together foundational explanations, application-focused examples, and practical demonstrations to help you assess when and how AFM can be applied in thin film characterization workflows.
Essential resources, from AFM fundamentals to real-world workflows
This knowledge pack brings together resources that explain how AFM is used to characterize thin films and coatings, from foundational principles and method selection to application-specific use cases and practical measurement workflows. It is designed to help you evaluate when and how AFM provides meaningful insight into structure-property relationships. The collection covers:
- Fundamental principles of AFM and nanoscale structure–property relationships in thin films
- Methods for measuring mechanical, electrical, and other local properties in thin films and coatings
- Practical considerations for selecting AFM modes and interpreting nanoscale measurements
- Applications of AFM across film systems, including polymers, semiconductors, and layered materials
- Examples thin film performance evaluation through correlated structure-property measurements
Webinar: Highest Resolution Characterization of Thin Films and Coatings; Topography & Physical Properties
RESOURCE TYPE: Video (part of our Thin Films & Coatings Symposium; full on-demand symposium access with knowledge pack)
LENGTH: ~30 minutes
DESCRIPTION:
Bruker experts explain how atomic force microscopy (AFM) enables nanoscale characterization of thin films and coatings by directly probing surface structure and local properties. Thin film challenges such as resolving nanoscale heterogeneity, interfaces, and ultra-thin layers are used to frame the need for AFM, and its high spatial resolution, direct measurement approach, and ability to correlate structure with multiple physical properties are presented as key advantages.
Presenters also highlight how these capabilities apply across a range of thin film systems — including polymer layers, semiconductor structures, and 2D materials — showing how AFM reveals structure-property relationships that govern performance.
VIEWERS WILL LEARN:
- What AFM is and how it measures nanoscale structure and properties in thin films
- Why nanoscale heterogeneity in thin films and coatings affects performance
- How AFM provides higher spatial resolution than alternative thin film characterization techniques
- What differentiates direct tip-based measurement from indirect methods for thin films
- Where AFM is applied across different thin film and coating material systems
- Why structure-property relationships are critical across thin film applications
Application Note: Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM
RESOURCE TYPE: Application Note [PDF]
LENGTH: 12 pages
DESCRIPTION:
This application note explores how PeakForce QNM enables quantitative mapping of mechanical properties such as modulus and adhesion at the nanoscale. It shows how localized mechanical measurements reveal variations in material structure, including cases relevant to heterogeneous thin films and coatings where mechanical behavior influences performance and reliability.
READERS WILL LEARN:
- What nanomechanical mapping is and how it is performed
- Why local mechanical properties matter in thin film and coating evaluation
- How AFM measures modulus and adhesion across heterogeneous materials
- What happens when mechanical contrast reveals variation in film structure
Webinar: AFM Imaging and Beyond: A Practical Guide to AFM Modes for Materials Research
RESOURCE TYPE: Video
LENGTH: ~1 hour 15 minutes
DESCRIPTION:
Bruker applications specialists present a broad overview of AFM measurement modes across electrical, mechanical, thermal, and chemical domains, using case studies from multiple material systems. The webinar shows how different AFM modes are used to measure distinct physical properties, including examples that are applicable to thin films and layered structures such as surface potential mapping and localized thermal analysis.
VIEWERS WILL LEARN:
- What types of properties AFM can measure beyond topography
- When to use different AFM modes for electrical, thermal, or mechanical characterization
- Why AFM is considered a multi-property platform across material systems
- What happens when different AFM modes are applied to layered and thin film-like materials
Application Note: Performing Hyperspectral Mapping with AFM DataCube Nanoelectrical Modes
RESOURCE TYPE: Application Note [PDF]
LENGTH: 14 pages
DESCRIPTION:
This application note explores how AFM DataCube nanoelectrical modes enable hyperspectral mapping of electrical properties across a sample. It demonstrates how multidimensional datasets provide deeper insight into spatial variation in material properties, including examples relevant to heterogeneous thin film systems where property variation occurs across domains.
READERS WILL LEARN:
- What hyperspectral mapping is in AFM and how it applies to material characterization
- How properties vary spatially across heterogeneous materials, including thin films
- Why multidimensional datasets improve understanding of material variation
- What happens when property behavior is mapped across multiple dimensions
Video: Topography- and Conductivity-Based Thin Film Measurements
RESOURCE TYPE: Video (part of "Characterization of Thin Dielectric Films with AFM"; full on-demand access with knowledge pack)
LENGTH: ~15 minutes
DESCRIPTION:
Bruker metrology specialists show how AFM is used to map both surface topography and electrical conductivity in thin dielectric films. The workflow demonstrates how nanoscale variations in film structure correspond to changes in conductivity, enabling identification of defects, non-uniformity, and performance-limiting regions in thin film systems.
VIEWERS WILL LEARN:
- What nanoscale conductivity mapping reveals about thin film behavior
- How thin film structure influences electrical performance
- Why defects and non-uniform regions affect thin film properties
- How AFM links topography to local property variation in thin films
Video: Charge- and Capacitance-Based Thin Film Measurements
RESOURCE TYPE: Video (part of "Characterization of Thin Dielectric Films with AFM"; full on-demand access with knowledge pack)
LENGTH: ~12 minutes
DESCRIPTION:
Bruker experts examine how AFM measures charge distribution and capacitance in thin dielectric films. The examples show how nanoscale variation in electrical properties impacts thin film behavior and performance, and how these measurements are used to evaluate uniformity and functional characteristics.
VIEWERS WILL LEARN:
- What capacitance mapping reveals about dielectric thin films
- Why nanoscale variation impacts thin film performance
- How AFM measures local electrical properties in thin films
- How to relate measured contrast to thin film behavior
Application Note: Nanoscale Mapping of Permittivity and Conductivity with Scanning Microwave Impedance Microscopy
RESOURCE TYPE: Application Note [PDF]
LENGTH: 10 pages
DESCRIPTION:
This application noteexplores how scanning microwave impedance microscopy (SMIM) enables nanoscale mapping of permittivity and conductivity in materials. It shows how subsurface electrical properties and dielectric variations can be resolved, including in layered and thin film structures where properties vary through thickness.
READERS WILL LEARN:
- What permittivity and conductivity mapping reveals in materials and thin films
- How SMIM measures subsurface electrical properties in layered structures
- Why dielectric variation is important for film performance
- What happens when electrical properties are resolved below the surface
Demo: Tunneling AFM on Dimension Icon AFM
RESOURCE TYPE: Real-time technical demonstration
LENGTH: ~8 minutes
DESCRIPTION:
Bruker experts demonstrate how tunneling AFM measurements are performed on thin film samples using a Dimension Icon system. The demonstration shows instrument setup, execution of conductivity mapping, and interpretation of nanoscale data used to evaluate property variation across film surfaces.
VIEWERS WILL LEARN:
- How to perform tunneling AFM measurements on thin films
- How to set up conductivity mapping experiments for thin film samples
- How to interpret nanoscale electrical measurement results in thin films
- When tunneling AFM is used for local conductivity analysis
Demo: Scanning Microwave Impedance Microscopy on Dimension Icon AFM
RESOURCE TYPE: Real-time technical demonstration
LENGTH: ~9 minutes
DESCRIPTION:
Bruker applications experts demonstrate how scanning microwave impedance microscopy (SMIM) is used to map permittivity and conductivity at the nanoscale. The demonstration shows measurement setup and how electrical contrast is interpreted to understand material variation in thin films and layered structures.
VIEWERS WILL LEARN:
- How to perform SMIM measurements on thin film samples
- How to map permittivity and conductivity at nanoscale resolution
- How to interpret electrical contrast in SMIM data
- When SMIM is used for dielectric and subsurface analysis
Demo: Conductivity mapping with PeakForce TUNA & the Dimension XR AFM
RESOURCE TYPE: Real-time technical demonstration
LENGTH: ~5 minutes
DESCRIPTION:
Bruker experts demonstrate how AFM measurements are performed in practice, including mapping local properties and selecting appropriate parameters. Embedded demonstrations show how measurement settings influence results and how data is collected across thin film surfaces.
VIEWERS WILL LEARN:
- How to perform AFM-based mapping of local properties
- How measurement parameters affect thin film data quality and interpretation
- What happens when tip–sample interaction is adjusted during measurement
- How to interpret multi-channel AFM outputs
