Every type of metallic coating originates and is constantly developed further due to different industrial demands. These include cost reduction, increased wear resistance or hardness, protection against corrosion, or for an individual decorative appearance.
These requirements can be achieved by using a large variety of element combinations in different coating processes, which can be seen in the astonishingly large range of specific coating structures existing today. To ensure optimal protection and minimal costs, the plating processes must be controlled to ensure these demands are met.
For non-destructive high-speed analysis of both, thickness and composition, and their development towards perfection, the common XRF technique often proves to be the best quality assurance tool for all of these combinations. However, due to the limitations of the technique, not all elements can be analyzed within the same level of efficiency, resulting in limited accuracy in the analysis.
Especially the direct analysis of embedded light elements within coatings, such as Sulfur (S) and Phosphorus (P), and analysis of plating solutions for the process control, can be more complicated for the manufacture than expected.
This webinar will present the new features of the Bruker M1 MISTRAL Micro-XRF analyzer to overcome these limitations and expand the coating analysis performance into the light element range for industrial purposes. Here the measurements and discussions are focused on the common example of electroless Nickel (Ni) plating with three levels (low, medium, high) of embedded Phosphorous (P) fulfilling different industrial demands. Also, the straight forward setup for analyzing plating solutions will be explained and demonstrated.
There will be a 15 minute Q&A session where our experts will answer your questions.
Senior Application Scientist micro-XRF, Bruker Nano Analytics
Product Manager Micro-XRF, Bruker Nano Analytics
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