Elemental map of leaves captured using a micro-XRF system
Elemental map of leaves captured using a micro-XRF system
BRUKER NANO ANALYTICS PRESENTS: Micro-XRF Back to the Roots Series - Part V

Advantages of Standard-Supported micro-XRF Quantification

On-Demand Session - 56 Minutes

Where are we today in terms of performance of fundamental parameter quantification?

Standard or certified reference samples are the main support for the vast majority of quantitative analytical techniques. Reference samples are used to validate analytical methods as well as to determine the composition of unknown samples. Developments in fundamental parameter (FP) quantification algorithms make them a valid alternative. 

FP quantification algorithms rest on the fact, that for micro-XRF almost the complete process from X-ray generation to data acquisition, including of course the interaction of X-rays with the sample, can be described using physical models and tabulated fundamental parameters. The current models allow the quantificaton of a sample without reference samples and with a high accuracy (<< 5 % relative error).

The remaining uncertainties can be attributed, mainly, to knowledge of the fundamental parameters themselves, and the description of the instrument properties (i.e. mostly the geometry). Interestingly, both issues can be overcome by combining the FP-quantification with well-defined reference samples. This combination of the best of two worlds, the flexibility of FP-based quantification with the reliability of a standard-based quantification, shows a path towards the future of high-precision quantitative material analysis.

The quality of standardless quantification today rivals that of standard-based quantification and the method is much more flexible. Specifically, any sample can be analysed without the need of an initial calibration and with a quality that matches that of traditional standard-based quantification.

In this webinar we will explore how fundamental parameter quantification can be used to carry out micro-XRF mapping and measurements with a high accuracy. We will explore how state-of-the-art FP quantification can be used to carry out standardless micro-XRF analysis that rivals standard-based measurements. 

If you would like learn more about state-of-the-art FP quantification join us for this last webinar of the back to the roots series.

If you found this webinar insightful we encourage you to watch our other “Back to the Roots” micro-XRF Webinars:

Values of standard-less quantification plotted against certified values of main and minor elements.
micro-XRF map of a set of Smithsonian reference materials.


Dr. Roald Tagle

Global Manager Application Science, Bruker Nano Analytics

Falk Reinhardt

Senior Application Scientist micro-XRF, Bruker Nano Analytics

Watch this Webinar On-Demand

Please enter your details below to gain on-demand access to this webinar. 

Input value is invalid.

* Please fill out the mandatory fields.

Please enter your first name
Please enter your first name
Please enter your e-mail address
Please enter your first company / institution
What best describes my current situation:
Please accept the Terms and Conditions

* Please fill out the mandatory fields.

Thank you. Enjoy your On-Demand Webinar

Thank you for signing up to watch our on-demand webinar Advantages of standard supported micro-XRF quantfication. We have also sent an email to your registered address containing the link to watch the webinar. 

If you have questions about the content of the webinar or about any of our other products and services, please contact us at info.bna@bruker.com.

You can also contact our regional offices by email at: 

Europe, Middle East and Africa: support.bna.emea@bruker.com
Asia-Pacific: support.bna.apac@bruker.com
Americas: support.bna.americas@bruker.com