SEM-XRF image of the rare earth elements present in various mineralogical samples
SEM-XRF image of the rare earth elements present in various mineralogical samples
BRUKER NANO ANALYTICS PRESENTS:

Analyzing Rare Earth Elements in Various Sample Types using micro-XRF on SEM

On-Demand Session - 55 Minutes

Rare Earth Element Analysis using micro-XRF on SEM

Rare Earth Elements (REE´s) are extremely useful and used in many modern components.  Consequently they are classified as critical elements in many western countries, especially given the current dominant production levels from China.  The identification and quantification of REE´s in various samples is thus crucial, whether it be for geological exploration and mining, component quality control, or recycling for the future. 

Micro-XRF is ideal to analyse large sample areas on the micro-scale and is a powerful analytical tool for identifying both trace elements and minerals with minimal preparation.  This is especially the case for samples that are also electron beam sensitive, such as specialized glasses. The addition of a micro-XRF source to your SEM will augment your laboratories capabilities.

In this webinar the benefits and capabilities of micro-XRF on SEM is discussed in the context of REE analysis within various fields of study.  

 

micro-XRF analysis on SEM of various mineral standards showing and image of overlaid rare earth and commonly associated elements.

Speakers

Dr. Andrew Menzies

Senior Application Scientist - Geology and Mining, Bruker Nano Analytics

Stephan Boehm

Product Manager micro-XRF on SEM and WDS, Bruker Nano Analytics

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