Analyzing Rare Earth Elements in Various Sample Types using micro-XRF on SEM
Rare Earth Element Analysis using micro-XRF on SEM
Rare Earth Elements (REE´s) are extremely useful and used in many modern components. Consequently they are classified as critical elements in many western countries, especially given the current dominant production levels from China. The identification and quantification of REE´s in various samples is thus crucial, whether it be for geological exploration and mining, component quality control, or recycling for the future.
Micro-XRF is ideal to analyse large sample areas on the micro-scale and is a powerful analytical tool for identifying both trace elements and minerals with minimal preparation. This is especially the case for samples that are also electron beam sensitive, such as specialized glasses. The addition of a micro-XRF source to your SEM will augment your laboratories capabilities.
In this webinar the benefits and capabilities of micro-XRF on SEM is discussed in the context of REE analysis within various fields of study.
Speakers
Dr. Andrew Menzies
Cientista de Aplicativos Sênior - Geologia e Mineração, Bruker Nano Analytics
Stephan Boehm
Product Manager - micro-XRF on SEM and WDS, Bruker Electron Microscope Analyzers
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